High dielectric oxides namely ZrO<SUB>2</SUB> and HfO<SUB>2</SUB> have gained a lot of importance as they are candidates in the electronic industry in the form of CMOS technology. A complete review of the literature examples of the precursors employed in the deposition of the thin films of these metal oxides, followed by methodology to design precursors with desirable physicochemical properties have been described in this review article
Ultrathin ZrO2 films were deposited on SiOx/Si in a multiwafer planetary metal-organic (MO)CVD react...
The atomic layer deposition (ALD) method was applied for fabricating high permittivity (high-k) diel...
Thin films of HfO2 were grown by metal-organic chemical vapour deposition on fused quartz substrates...
The thesis describes rational development of metalorganic precursors of Zr and Hf for the deposition...
Hafnium oxide films were deposited on Si(100) substrates using pulsed metal-organic chemical vapor d...
This thesis investigates the relation between the growth process, structure and properties of three ...
Due to the constantly decreasing dimensions of electronic devices, the conventional dielectric mater...
The paper will introduce a simple new method on the synthesis of both hafnium and zirconium nitrate ...
The preparat ion of th in films of zirconium oxide and ha fn ium ox ide by decomposition of the dike...
International audienceThe downscaling in CMOS transistors requires the introduction of new materials...
Metal-organic precursors of Zr and Hf with excellent vaporization characteristics and low decomposit...
The properties of metal oxides with high dielectric constant (k) are being extensively studied for u...
Thin films of high-k oxides are presently used in semiconductor industry as gate dielectrics. In thi...
As the MOS devices continue to scale down in feature size, the gate oxide thickness is approaching t...
Two novel mononuclear mixed alkoxide compounds of Ti and Zr, [Ti(OPri)(2) (tbaoac)(2)] and [Zr(OPri)...
Ultrathin ZrO2 films were deposited on SiOx/Si in a multiwafer planetary metal-organic (MO)CVD react...
The atomic layer deposition (ALD) method was applied for fabricating high permittivity (high-k) diel...
Thin films of HfO2 were grown by metal-organic chemical vapour deposition on fused quartz substrates...
The thesis describes rational development of metalorganic precursors of Zr and Hf for the deposition...
Hafnium oxide films were deposited on Si(100) substrates using pulsed metal-organic chemical vapor d...
This thesis investigates the relation between the growth process, structure and properties of three ...
Due to the constantly decreasing dimensions of electronic devices, the conventional dielectric mater...
The paper will introduce a simple new method on the synthesis of both hafnium and zirconium nitrate ...
The preparat ion of th in films of zirconium oxide and ha fn ium ox ide by decomposition of the dike...
International audienceThe downscaling in CMOS transistors requires the introduction of new materials...
Metal-organic precursors of Zr and Hf with excellent vaporization characteristics and low decomposit...
The properties of metal oxides with high dielectric constant (k) are being extensively studied for u...
Thin films of high-k oxides are presently used in semiconductor industry as gate dielectrics. In thi...
As the MOS devices continue to scale down in feature size, the gate oxide thickness is approaching t...
Two novel mononuclear mixed alkoxide compounds of Ti and Zr, [Ti(OPri)(2) (tbaoac)(2)] and [Zr(OPri)...
Ultrathin ZrO2 films were deposited on SiOx/Si in a multiwafer planetary metal-organic (MO)CVD react...
The atomic layer deposition (ALD) method was applied for fabricating high permittivity (high-k) diel...
Thin films of HfO2 were grown by metal-organic chemical vapour deposition on fused quartz substrates...