Add to ORKGWe develop a simple model that computes the probability that a strike at the output of a gate has an impact in any output by traversing the circuits backwards from the outputs and gaining information about the logical masking using signal probabilities. The model is validated with fault injectio
10.1109/TCAD.2007.891036IEEE Transactions on Computer-Aided Design of Integrated Circuits and System...
We present a soft error rate (SER) analysis methodology within a simulation and design environment t...
With technology scaling, vulnerability to soft errors in random logic is increasing. There is a need...
We develop a simple model that computes the probability that a strike at the output of a gate has an...
Integrated circuits are getting increasingly vulnerable to soft errors; as a consequence, soft error...
Single Event Upsets (SEU) arising from atmospheric neutrons and alpha particles are becoming increas...
Abstract — Accurate electrical masking modeling represents a significant challenge in soft error rat...
In recent years, soft errors happen in the combinational logic circuits that genuinely impact the ac...
ISBN:978-1-4244-4321-5International audienceEvaluating the potential functional effects of soft erro...
Due to reduction in device feature size and supply voltage, the sensitivity to radiation induced tra...
Soft errors due to cosmic rays cause reliability problems during lifetime operation of digital syste...
Integrated circuits (ICs) increasingly exhibit uncertain characteristics due to soft errors, inheren...
International audienceTechnology scaling in modern electronic circuits shrinks the transistor size a...
Integrated circuits are increasingly susceptible to uncertainty caused by soft errors, inherently pr...
Reliability of VLSI circuits had always been a major issue during the design process. It becomes mor...
10.1109/TCAD.2007.891036IEEE Transactions on Computer-Aided Design of Integrated Circuits and System...
We present a soft error rate (SER) analysis methodology within a simulation and design environment t...
With technology scaling, vulnerability to soft errors in random logic is increasing. There is a need...
We develop a simple model that computes the probability that a strike at the output of a gate has an...
Integrated circuits are getting increasingly vulnerable to soft errors; as a consequence, soft error...
Single Event Upsets (SEU) arising from atmospheric neutrons and alpha particles are becoming increas...
Abstract — Accurate electrical masking modeling represents a significant challenge in soft error rat...
In recent years, soft errors happen in the combinational logic circuits that genuinely impact the ac...
ISBN:978-1-4244-4321-5International audienceEvaluating the potential functional effects of soft erro...
Due to reduction in device feature size and supply voltage, the sensitivity to radiation induced tra...
Soft errors due to cosmic rays cause reliability problems during lifetime operation of digital syste...
Integrated circuits (ICs) increasingly exhibit uncertain characteristics due to soft errors, inheren...
International audienceTechnology scaling in modern electronic circuits shrinks the transistor size a...
Integrated circuits are increasingly susceptible to uncertainty caused by soft errors, inherently pr...
Reliability of VLSI circuits had always been a major issue during the design process. It becomes mor...
10.1109/TCAD.2007.891036IEEE Transactions on Computer-Aided Design of Integrated Circuits and System...
We present a soft error rate (SER) analysis methodology within a simulation and design environment t...
With technology scaling, vulnerability to soft errors in random logic is increasing. There is a need...