Abstract—Process variability and environmental fluctuations deeply affect the digital circuits performance in many different ways, one of them, the data processing time which may cause error on synchronous digital circuits due to underestimated time violations. This situation is commonly avoided adding time margins to the clock signal making it larger than nominal worstcase data process time, penalizing the global performance. In this paper a new mechanism for compensating both environmental fluctuations and process parameters variations effects on digital circuits is presented. The environmental compensation mechanism regenerates the clock signal for a pipelined system stages adding a compensated skew component depending on the local envir...
Current and future semiconductor technology nodes, bring about a variety of challenges that pertain ...
As technology node continues to shrink to achieve higher performance at high density, it has become ...
Abstract—This paper reports on the design and characterization of a process, temperature and supply ...
Environmental conditions are changing all the time along the chip as a consequence of its own activi...
none4Clock compensation for process variations and manufacturing defects is a key strategy to achie...
Integrated Circuit (IC) designers have always faced the problem of small deviations in parameters of...
As integrated circuits are scaled down it becomes dif-ficult to maintain uniformity in process param...
CMOS scaling has enabled circuit designers to develop a wide variety of fully integrated mixed signa...
In this paper, we analyze the impact of process variations on the clock skew of VLSI circuits design...
With the development of Very-Deep Sub-Micron technologies, process variability is becoming increasin...
Over the last few years, considerable variability in deep submicron integrated circuits has become a...
Clock distribution is vital to all synchronous integrated circuits; a poor clock distribution networ...
As the semiconductor technology advances, minimum feature sizes are reduced and clock speeds are inc...
none4We propose a low cost scheme for the dynamic compensation in the field of undesired skew and du...
With the advance of fabrication technology into the deep sub-micron era process parameter variations...
Current and future semiconductor technology nodes, bring about a variety of challenges that pertain ...
As technology node continues to shrink to achieve higher performance at high density, it has become ...
Abstract—This paper reports on the design and characterization of a process, temperature and supply ...
Environmental conditions are changing all the time along the chip as a consequence of its own activi...
none4Clock compensation for process variations and manufacturing defects is a key strategy to achie...
Integrated Circuit (IC) designers have always faced the problem of small deviations in parameters of...
As integrated circuits are scaled down it becomes dif-ficult to maintain uniformity in process param...
CMOS scaling has enabled circuit designers to develop a wide variety of fully integrated mixed signa...
In this paper, we analyze the impact of process variations on the clock skew of VLSI circuits design...
With the development of Very-Deep Sub-Micron technologies, process variability is becoming increasin...
Over the last few years, considerable variability in deep submicron integrated circuits has become a...
Clock distribution is vital to all synchronous integrated circuits; a poor clock distribution networ...
As the semiconductor technology advances, minimum feature sizes are reduced and clock speeds are inc...
none4We propose a low cost scheme for the dynamic compensation in the field of undesired skew and du...
With the advance of fabrication technology into the deep sub-micron era process parameter variations...
Current and future semiconductor technology nodes, bring about a variety of challenges that pertain ...
As technology node continues to shrink to achieve higher performance at high density, it has become ...
Abstract—This paper reports on the design and characterization of a process, temperature and supply ...