This paper presents an improved modeling of the effect of random mismatch and current source transient switching behavior on the performance of current-steering CMOS digital-toanalog converters (DACs). The work considers two current source cell topologies, namely a simple cell and a cascoded cell, obtaining the relation of transistors design parameters to the static and dynamic models. On the one hand, a mismatching statistical analysis is applied to all the transistors of the current source circuit, which allows to define design expressions relating the circuit parameters to the DAC specifications without the need of arbitrary design margins or Monte Carlo simulations. On the other hand, improved analysis of the current source switching ch...
This chapter reviews some of the DAC error mechanisms that can be counteracted by correction methods...
This paper presents a simulation model for fast and efficient prediction of the dynamic properties o...
This chapter reviews some of the DAC error mechanisms that can be counteracted by correction methods...
This paper presents an improved modeling of the effect of random mismatch and current source transi...
Abstract—This paper presents an improved modeling of the ef-fect of random mismatch and current sour...
With the shrinking of device sizes, random device variations become a key factor limiting the perfor...
With the shrinking of device sizes, random device variations become a key factor limiting the perfor...
With the shrinking of device sizes, random device variations become a key factor limiting the perfor...
With the shrinking of device sizes, random device variations become a key factor limiting the perfor...
Random device variations are a key factor limiting the performances of high-resolution CMOS current ...
Random device variations are a key factor limiting the performances of high-resolution CMOS current ...
Random device variations are a key factor limiting the performances of high-resolution CMOS current ...
Random device variations are a key factor limiting the performances of high-resolution CMOS current ...
Digital-to-Analog Converter (DAC) is a crucial building block limiting the accuracy and speed of man...
This paper presents a simulation model for fast and efficient prediction of the dynamic properties o...
This chapter reviews some of the DAC error mechanisms that can be counteracted by correction methods...
This paper presents a simulation model for fast and efficient prediction of the dynamic properties o...
This chapter reviews some of the DAC error mechanisms that can be counteracted by correction methods...
This paper presents an improved modeling of the effect of random mismatch and current source transi...
Abstract—This paper presents an improved modeling of the ef-fect of random mismatch and current sour...
With the shrinking of device sizes, random device variations become a key factor limiting the perfor...
With the shrinking of device sizes, random device variations become a key factor limiting the perfor...
With the shrinking of device sizes, random device variations become a key factor limiting the perfor...
With the shrinking of device sizes, random device variations become a key factor limiting the perfor...
Random device variations are a key factor limiting the performances of high-resolution CMOS current ...
Random device variations are a key factor limiting the performances of high-resolution CMOS current ...
Random device variations are a key factor limiting the performances of high-resolution CMOS current ...
Random device variations are a key factor limiting the performances of high-resolution CMOS current ...
Digital-to-Analog Converter (DAC) is a crucial building block limiting the accuracy and speed of man...
This paper presents a simulation model for fast and efficient prediction of the dynamic properties o...
This chapter reviews some of the DAC error mechanisms that can be counteracted by correction methods...
This paper presents a simulation model for fast and efficient prediction of the dynamic properties o...
This chapter reviews some of the DAC error mechanisms that can be counteracted by correction methods...