The trend of downsizing transistors and operating voltage scaling has made the processor chip more sensitive against radiation phenomena making soft errors an important challenge. New reliability techniques for handling soft errors in the logic and memories that allow meeting the desired failures-in-time (FIT) target are key to keep harnessing the benefits of Moore's law. The failure to scale the soft error rate caused by particle strikes, may soon limit the total number of cores that one may have running at the same time. This paper proposes a light-weight and scalable architecture to eliminate silent data corruption errors (SDC) and detected unrecoverable errors (DUE) of a core. The architecture uses acoustic wave detectors for error dete...
According to Moore’s law, technology scaling is continuously providing smaller and faster devices. T...
Technology scaling leads to burn-in phase out and increasing post-silicon test complexity, which inc...
Soft errors are an important challenge in contemporary microprocessors. Particle hits on the compone...
The vulnerability of the current and future processors towards transient errors caused by particle s...
Cosmic radiation induced soft errors have emerged as a key challenge in computer system design. The ...
The continuing decrease in dimensions and operating voltage of transistors has increased their sensi...
The continuing decrease in dimensions and operating voltage of transistors has increased their sensi...
The sustained drive to downsize the transistors has reached a point where device sensitivity against...
According to Moore’s law, technology scaling is continuously providing smaller and faster devices. T...
Abstract—Reducing device dimensions, increasing transistor densities, and smaller timing windows, ex...
The ever-increasing miniaturization of semiconductors has led to important advances in mobile, cloud...
Soft errors (or Transient faults) are temporary faults that arise in a circuit due to a variety of i...
The occurrence of transient faults like soft errors in computer circuits poses a significant challen...
Soft errors are an important challenge in contemporary microprocessors. Particle hits on the compone...
Hardware errors are on the rise with reducing chip sizes, and power constraints have necessitated th...
According to Moore’s law, technology scaling is continuously providing smaller and faster devices. T...
Technology scaling leads to burn-in phase out and increasing post-silicon test complexity, which inc...
Soft errors are an important challenge in contemporary microprocessors. Particle hits on the compone...
The vulnerability of the current and future processors towards transient errors caused by particle s...
Cosmic radiation induced soft errors have emerged as a key challenge in computer system design. The ...
The continuing decrease in dimensions and operating voltage of transistors has increased their sensi...
The continuing decrease in dimensions and operating voltage of transistors has increased their sensi...
The sustained drive to downsize the transistors has reached a point where device sensitivity against...
According to Moore’s law, technology scaling is continuously providing smaller and faster devices. T...
Abstract—Reducing device dimensions, increasing transistor densities, and smaller timing windows, ex...
The ever-increasing miniaturization of semiconductors has led to important advances in mobile, cloud...
Soft errors (or Transient faults) are temporary faults that arise in a circuit due to a variety of i...
The occurrence of transient faults like soft errors in computer circuits poses a significant challen...
Soft errors are an important challenge in contemporary microprocessors. Particle hits on the compone...
Hardware errors are on the rise with reducing chip sizes, and power constraints have necessitated th...
According to Moore’s law, technology scaling is continuously providing smaller and faster devices. T...
Technology scaling leads to burn-in phase out and increasing post-silicon test complexity, which inc...
Soft errors are an important challenge in contemporary microprocessors. Particle hits on the compone...