In dynamic atomic force microscopy, nanoscale properties are encoded in the higher harmonics. Nevertheless, when gentle interactions and minimal invasiveness are required, these harmonics are typically undetectable. Here, we propose to externally drive an arbitrary number of exact higher harmonics above the noise level. In this way, multiple contrast channels that are sensitive to compositional variations are made accessible. Numerical integration of the equation of motion shows that the external introduction of exact harmonic frequencies does not compromise the fundamental frequency. Thermal fluctuations are also considered within the detection bandwidth of interest and discussed in terms of higher-harmonic phase contrast in the presence a...
A method to enhance the harmonics of tapping mode atomic force microscopy is proposed in this study ...
Harmonic atomic force microscopy (AFM) was employed to discriminate between different materials and ...
Abstract. Motion of a tip used in an atomic force microscope can be described by the Lennard-Jones p...
In dynamic atomic force microscopy, nanoscale properties are encoded in the higher harmonics. Nevert...
Higher-harmonics generation in a tapping-mode atomic force microscope is a consequence of the nonlin...
Cataloged from PDF version of article.Higher harmonics in tapping-mode atomic force microscopy offer...
Increasing the signal-to-noise ratio in dynamic atomic force microscopy plays a key role in nanomech...
We systematically investigate higher harmonics in the vibration spectrum of scanning force microscop...
To maximize the spatial resolution of atomic force microscopy (AFM), it is helpful to isolate the sp...
The Atomic Force Microscope (AFM) is a versatile tool for studying and characterizing materials at t...
The natural frequencies of a cantilever probe can be tuned with an attached concentrated mass to coi...
Cataloged from PDF version of article.In a tapping-mode atomic force microscope, the frequency spect...
In tapping-mode atomic force microscopy, nonlinear tip-sample interactions give rise to higher harmo...
In atomic force microscopy (AFM), the higher modes are highly sensitive to the tip-sample interactio...
A simple model of a damped, harmonic oscillator is used to describe the motion of an atomic force mi...
A method to enhance the harmonics of tapping mode atomic force microscopy is proposed in this study ...
Harmonic atomic force microscopy (AFM) was employed to discriminate between different materials and ...
Abstract. Motion of a tip used in an atomic force microscope can be described by the Lennard-Jones p...
In dynamic atomic force microscopy, nanoscale properties are encoded in the higher harmonics. Nevert...
Higher-harmonics generation in a tapping-mode atomic force microscope is a consequence of the nonlin...
Cataloged from PDF version of article.Higher harmonics in tapping-mode atomic force microscopy offer...
Increasing the signal-to-noise ratio in dynamic atomic force microscopy plays a key role in nanomech...
We systematically investigate higher harmonics in the vibration spectrum of scanning force microscop...
To maximize the spatial resolution of atomic force microscopy (AFM), it is helpful to isolate the sp...
The Atomic Force Microscope (AFM) is a versatile tool for studying and characterizing materials at t...
The natural frequencies of a cantilever probe can be tuned with an attached concentrated mass to coi...
Cataloged from PDF version of article.In a tapping-mode atomic force microscope, the frequency spect...
In tapping-mode atomic force microscopy, nonlinear tip-sample interactions give rise to higher harmo...
In atomic force microscopy (AFM), the higher modes are highly sensitive to the tip-sample interactio...
A simple model of a damped, harmonic oscillator is used to describe the motion of an atomic force mi...
A method to enhance the harmonics of tapping mode atomic force microscopy is proposed in this study ...
Harmonic atomic force microscopy (AFM) was employed to discriminate between different materials and ...
Abstract. Motion of a tip used in an atomic force microscope can be described by the Lennard-Jones p...