The continuing decrease in dimensions and operating voltage of transistors has increased their sensitivity against radiation phenomena making soft errors an important challenge in future chip multiprocessors (CMPs). Hence, new techniques for detecting errors in the logic and memories that allow meeting the desired failures-in-time (FIT) budget in CMPs are required. This paper proposes a low-cost dynamic particle strike detection mechanism through acoustic wave detectors. Our results show that our mechanism can protect both the logic and the memory arrays. As a case study, we also show how this technique can be combined with error codes to protect the last-level cache at low cost.Peer Reviewe
As the devices are scaling down, the combinational logic will become susceptible to soft errors. The...
This thesis deals primarily with the problem of soft-error tolerance in digital machines. The possib...
A portable high speed digital electronic DRAM radiation detection system was designed and constructe...
The continuing decrease in dimensions and operating voltage of transistors has increased their sensi...
The vulnerability of the current and future processors towards transient errors caused by particle s...
The trend of downsizing transistors and operating voltage scaling has made the processor chip more s...
Cosmic radiation induced soft errors have emerged as a key challenge in computer system design. The ...
The sustained drive to downsize the transistors has reached a point where device sensitivity against...
Heavy charged particle induced soft errors in semiconductor memory devices have been a field failure...
The negative impact of the aggressive scaling of technology nodes on the sensitivity of CMOS devices...
Successive generations of processors use smaller transistors in the quest to make more powerful comp...
The occurrence of transient faults like soft errors in computer circuits poses a significant challen...
Abstract — Soft errors are functional failures resulting from the latching of single-event transient...
Soft errors are an important challenge in contemporary microprocessors. Particle hits on the compone...
As the devices are scaling down, the combinational logic will become susceptible to soft errors. The...
As the devices are scaling down, the combinational logic will become susceptible to soft errors. The...
This thesis deals primarily with the problem of soft-error tolerance in digital machines. The possib...
A portable high speed digital electronic DRAM radiation detection system was designed and constructe...
The continuing decrease in dimensions and operating voltage of transistors has increased their sensi...
The vulnerability of the current and future processors towards transient errors caused by particle s...
The trend of downsizing transistors and operating voltage scaling has made the processor chip more s...
Cosmic radiation induced soft errors have emerged as a key challenge in computer system design. The ...
The sustained drive to downsize the transistors has reached a point where device sensitivity against...
Heavy charged particle induced soft errors in semiconductor memory devices have been a field failure...
The negative impact of the aggressive scaling of technology nodes on the sensitivity of CMOS devices...
Successive generations of processors use smaller transistors in the quest to make more powerful comp...
The occurrence of transient faults like soft errors in computer circuits poses a significant challen...
Abstract — Soft errors are functional failures resulting from the latching of single-event transient...
Soft errors are an important challenge in contemporary microprocessors. Particle hits on the compone...
As the devices are scaling down, the combinational logic will become susceptible to soft errors. The...
As the devices are scaling down, the combinational logic will become susceptible to soft errors. The...
This thesis deals primarily with the problem of soft-error tolerance in digital machines. The possib...
A portable high speed digital electronic DRAM radiation detection system was designed and constructe...