The ever-increasing need for higher performance and more complex functionality pushes the electronics industry to find a faster and more efficient way to test and debug an Integrated Circuit (IC). Currently, the IEEE Std. 1149.1, known as Joint Test Action Group (JTAG) is considered as state of the art by the industry. JTAG is used to perform debugging and testing through Test Access Port (TAP). However, the IEEE Std. 1149.1 standard has three major drawbacks, such as: • Lack of flexibility of hardware and scalability in scheduling the access to the instruments; • Boundary Scan Definition Language (BSDL), which is part of the JTAG standard, is insufficient to describe the myriad types of instruments present in an IC; • Absence of a language...
Standard access methods for Design for Testsbility (DfT) rely on the IEEE 1149.1 (JTAG) Test Access ...
Modern integrated circuits (ICs) include thousands of on-chip instruments to ensure that specificati...
This paper describes a novel optimized JTAG interface circuit between a JTAG controller and target I...
Reconfigurable scan networks (RSNs), like IEEE Std. 1687 networks, offer flexible and scalable acces...
As transistors in integrated circuits (ICs) are becoming smaller, faster and more, it has become har...
The constant need for higher performance and more advanced functionality has made the design and man...
Modern integrated circuits (ICs) contain thousands of instruments to enable testing, tuning, monitor...
This paper discusses the reuse and retargeting of test instruments and test patterns using the IEEE ...
The IEEE Std. P1687.1 working group is currently exploring alternatives to IEEE Std. 1149.1 test acc...
While the advancement in semiconductor technologies enables manufacturing of highly advanced and com...
International audienceMany modern devices have a very limited number of digital pins, yet they are o...
The IEEE Std. P1687.1 is exploring alternatives to IEEE Std. 1149.1 test access port for accessing I...
As semiconductor technologies enables highly advanced an complex integrated circuits (ICs), there is...
The IEEE P1687 (IJTAG) standard proposal aimsat standardizing the access to embedded test and debug ...
Embedded instruments are becoming used more often in modern SoCs for different testing and measureme...
Standard access methods for Design for Testsbility (DfT) rely on the IEEE 1149.1 (JTAG) Test Access ...
Modern integrated circuits (ICs) include thousands of on-chip instruments to ensure that specificati...
This paper describes a novel optimized JTAG interface circuit between a JTAG controller and target I...
Reconfigurable scan networks (RSNs), like IEEE Std. 1687 networks, offer flexible and scalable acces...
As transistors in integrated circuits (ICs) are becoming smaller, faster and more, it has become har...
The constant need for higher performance and more advanced functionality has made the design and man...
Modern integrated circuits (ICs) contain thousands of instruments to enable testing, tuning, monitor...
This paper discusses the reuse and retargeting of test instruments and test patterns using the IEEE ...
The IEEE Std. P1687.1 working group is currently exploring alternatives to IEEE Std. 1149.1 test acc...
While the advancement in semiconductor technologies enables manufacturing of highly advanced and com...
International audienceMany modern devices have a very limited number of digital pins, yet they are o...
The IEEE Std. P1687.1 is exploring alternatives to IEEE Std. 1149.1 test access port for accessing I...
As semiconductor technologies enables highly advanced an complex integrated circuits (ICs), there is...
The IEEE P1687 (IJTAG) standard proposal aimsat standardizing the access to embedded test and debug ...
Embedded instruments are becoming used more often in modern SoCs for different testing and measureme...
Standard access methods for Design for Testsbility (DfT) rely on the IEEE 1149.1 (JTAG) Test Access ...
Modern integrated circuits (ICs) include thousands of on-chip instruments to ensure that specificati...
This paper describes a novel optimized JTAG interface circuit between a JTAG controller and target I...