A circuit design for technology of near-field interference microwave microscopy using evanescent fields of several active radiators (probes) is suggested and substantiated. The feasibility of providing the spatial overlap of the evanescent fields of two probes representing expanding coaxial conical horns is demonstrated. It is shown that the structure of the electromagnetic field in the region of overlap can effectively be controlled by changing the phase difference of oscillations arriving at inputs of the probes. This technology can be used for diagnostics of liquid media comprising dielectric inhomogeneities, flaw detection, and hygroscopy
International audienceThe near-field measurement is based generally on the use of purely passive min...
A near-field scanning millimeter-wave frequency microscope built inside a scanning electron microsco...
A near-field microwave nondestructive diagnostics based on the total reflection phenomenon is descri...
A circuit design for technology of near-field interference microwave microscopy using evanescent fie...
A circuit design for technology of near-field interference microwave microscopy using evanescent fie...
A schematic solution of the near-field interference microwave microscopy technology is discussed. Th...
A schematic solution of the near-field interference microwave microscopy technology is discussed. Th...
We describe the operation of a simple near-field interference microwave microscope. The microscope c...
International audienceWe report an original near-field microwave microscope based on an interferomet...
International audienceNear-field scanning microwave microscopy (NSMM) is a scanning probe microscopy...
THESIS 6918The topic of this thesis is the development and testing of measurement techniques for hig...
Les techniques de microscopies hyperfréquences à balayage en champ proche connaissent un intérêt gra...
AbstractWe report an original near-field microwave microscope based on an interferometric technique ...
Microwave near-field microscopes are emerging tools for material characterization. In this work, a n...
This proposal is devoted to a collaborative approach dealing with microwave microscopy experiments. ...
International audienceThe near-field measurement is based generally on the use of purely passive min...
A near-field scanning millimeter-wave frequency microscope built inside a scanning electron microsco...
A near-field microwave nondestructive diagnostics based on the total reflection phenomenon is descri...
A circuit design for technology of near-field interference microwave microscopy using evanescent fie...
A circuit design for technology of near-field interference microwave microscopy using evanescent fie...
A schematic solution of the near-field interference microwave microscopy technology is discussed. Th...
A schematic solution of the near-field interference microwave microscopy technology is discussed. Th...
We describe the operation of a simple near-field interference microwave microscope. The microscope c...
International audienceWe report an original near-field microwave microscope based on an interferomet...
International audienceNear-field scanning microwave microscopy (NSMM) is a scanning probe microscopy...
THESIS 6918The topic of this thesis is the development and testing of measurement techniques for hig...
Les techniques de microscopies hyperfréquences à balayage en champ proche connaissent un intérêt gra...
AbstractWe report an original near-field microwave microscope based on an interferometric technique ...
Microwave near-field microscopes are emerging tools for material characterization. In this work, a n...
This proposal is devoted to a collaborative approach dealing with microwave microscopy experiments. ...
International audienceThe near-field measurement is based generally on the use of purely passive min...
A near-field scanning millimeter-wave frequency microscope built inside a scanning electron microsco...
A near-field microwave nondestructive diagnostics based on the total reflection phenomenon is descri...