Add to ORKGLet a circuit have m outputs, m>1. There are two ways to test this circuit by means of a signature analyzer: use a single input analyzer for each output or use an m-input analyzer to test all outputs simultaneously. The main goal of this letter is to demonstrate that for fault output sequences with small multiplicity of errors and long length the second approach is more effective. © 1993 Kluwer Academic Publishers
We propose an approach to design of an algebraic signature analyzer that can be used for mixed-signa...
The use of the modified binary counter, as a test generator, is shown to allow to detect 100% of err...
Built-in Self-Test (BIST) is becoming a widely accepted means for testing VLSI circuits. BIST usual...
Let a circuit have m outputs, m>1. There are two ways to test this circuit by means of a signature a...
A test system is considered in which the signature analyzer, i.e. the most frequently applied system...
Many test schemes use signature analyzers to compact the responses of a circuit under test. Unfortun...
The signature analyzers (SA) are widely applied in the systems of built-in testing of digital device...
International audienceIn this paper a multi-mode signature analyser is proposed to be built into ana...
The possibility of error detection and exhaustive error testing during functioning off programed log...
AbstractA methodology for circuit testing is proposed for detecting multiple circuit faults in the c...
AbstractParallel signature analyzers (PSAs) implemented as multiple input linear feedback shift regi...
A signature analyzer of a built-in self test circuit is proposed to analyze stuck-at-faults occurrin...
121 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1987.This thesis presents new appr...
[[abstract]]A fast multiple input signature register (MISR) computation algorithm for signature simu...
We propose an approach to design of an algebraic signature analyzer that can be used for mixed-signa...
The use of the modified binary counter, as a test generator, is shown to allow to detect 100% of err...
Built-in Self-Test (BIST) is becoming a widely accepted means for testing VLSI circuits. BIST usual...
Let a circuit have m outputs, m>1. There are two ways to test this circuit by means of a signature a...
A test system is considered in which the signature analyzer, i.e. the most frequently applied system...
Many test schemes use signature analyzers to compact the responses of a circuit under test. Unfortun...
The signature analyzers (SA) are widely applied in the systems of built-in testing of digital device...
International audienceIn this paper a multi-mode signature analyser is proposed to be built into ana...
The possibility of error detection and exhaustive error testing during functioning off programed log...
AbstractA methodology for circuit testing is proposed for detecting multiple circuit faults in the c...
AbstractParallel signature analyzers (PSAs) implemented as multiple input linear feedback shift regi...
A signature analyzer of a built-in self test circuit is proposed to analyze stuck-at-faults occurrin...
121 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1987.This thesis presents new appr...
[[abstract]]A fast multiple input signature register (MISR) computation algorithm for signature simu...
We propose an approach to design of an algebraic signature analyzer that can be used for mixed-signa...
The use of the modified binary counter, as a test generator, is shown to allow to detect 100% of err...
Built-in Self-Test (BIST) is becoming a widely accepted means for testing VLSI circuits. BIST usual...