Add to ORKGA test system is considered in which the signature analyzer, i.e. the most frequently applied system of built-in testing, is used for compression of the output sequence of a tested device. A system of built-in testing of combinational circuits is suggested that uses a linear sequential machine for compression of the input and output sequence and allows to detect single faults of a circuit implemented in the form of a programmed logic matrix on the basis of perfect disjunctive normal form of the output functions
SIGLECNRS T Bordereau / INIST-CNRS - Institut de l'Information Scientifique et TechniqueFRFranc
We propose an approach to design of an algebraic signature analyzer that can be used for mixed-signa...
AbstractParallel signature analyzers (PSAs) implemented as multiple input linear feedback shift regi...
A test system is considered in which the signature analyzer, i.e. the most frequently applied system...
Let a circuit have m outputs, m>1. There are two ways to test this circuit by means of a signature a...
A signature analyzer of a built-in self test circuit is proposed to analyze stuck-at-faults occurrin...
The possibility of error detection and exhaustive error testing during functioning off programed log...
Many test schemes use signature analyzers to compact the responses of a circuit under test. Unfortun...
The aim is to create the theoretical bases, algorithms and practical circuits of the built-in testin...
In this paper, we focus on the use of signature-based output compaction technique for built-in self-...
Signature analysis is a well established technique in digital system maintenance. The paper illustra...
It is shown the usage of binary counter as test generator for programmable boolean matrix permits by...
Systems of built-in testing contain a test generator and a signature analyzer (SA). At last time exp...
The signature analyzers (SA) are widely applied in the systems of built-in testing of digital device...
Built-in Self-test of a digital circuit is carried out by using on-chip pattern generator to apply i...
SIGLECNRS T Bordereau / INIST-CNRS - Institut de l'Information Scientifique et TechniqueFRFranc
We propose an approach to design of an algebraic signature analyzer that can be used for mixed-signa...
AbstractParallel signature analyzers (PSAs) implemented as multiple input linear feedback shift regi...
A test system is considered in which the signature analyzer, i.e. the most frequently applied system...
Let a circuit have m outputs, m>1. There are two ways to test this circuit by means of a signature a...
A signature analyzer of a built-in self test circuit is proposed to analyze stuck-at-faults occurrin...
The possibility of error detection and exhaustive error testing during functioning off programed log...
Many test schemes use signature analyzers to compact the responses of a circuit under test. Unfortun...
The aim is to create the theoretical bases, algorithms and practical circuits of the built-in testin...
In this paper, we focus on the use of signature-based output compaction technique for built-in self-...
Signature analysis is a well established technique in digital system maintenance. The paper illustra...
It is shown the usage of binary counter as test generator for programmable boolean matrix permits by...
Systems of built-in testing contain a test generator and a signature analyzer (SA). At last time exp...
The signature analyzers (SA) are widely applied in the systems of built-in testing of digital device...
Built-in Self-test of a digital circuit is carried out by using on-chip pattern generator to apply i...
SIGLECNRS T Bordereau / INIST-CNRS - Institut de l'Information Scientifique et TechniqueFRFranc
We propose an approach to design of an algebraic signature analyzer that can be used for mixed-signa...
AbstractParallel signature analyzers (PSAs) implemented as multiple input linear feedback shift regi...