This paper presents a quantitative simulation of the phase separation and coarsening phenomenon in eutectic tin/lead (SnPb) solders. The computer modeling is based on continuum theory and field phase models which were evaluated using the most recently available data for the free energy of the tin/lead system, diffusional and mobility coefficients, elastic constants as well as surface tensions of both phases. The model presented allows to study the influence as well as the interaction between classical diffusion of the Fickean type, surface energies according to Cahn and Hilliard, as well as stresses and strains on phase separation and coarsening. An attempt is made to compare the temporal development of a eutectic SnPb microstructure at dif...
A wide variety of phase evolution phenomena observed in solids such as intermetallic growth at the j...
A critical issue in the long-term reliability of solder connections used in electronic packages is t...
In microelectronic assemblies, the fatigue life of solder joints is a critical element of the overal...
This paper presents a quantitative simulation of the phase separation and coarsening phenomenon in e...
This paper presents a model, which is capable to simulate the coarsening process observed during the...
This paper presents a detailed numerical simulation of the coarsening phenomenon observed in microel...
AbstractSolders represent highly versatile and useful materials. They provide a broad range of techn...
The reliability of soldered connections is a very important issue in electronics industry. This proj...
This study is devoted to providing a mechanistic rationale of coarsening induced failure in solder a...
Microstructural length scales are relatively large in typical soldered connections. The microstructu...
Microstructural length scales are relatively largein typical soldered connections. A microstructure ...
In solder-copper diffusion couples an intermetallic compound layer forms when tin in the solder allo...
In solder-copper diffusion couples an intermetallic compound layer forms when tin in the solder allo...
A significant reliability concern with traditional lead-free solder alloys is the degradation of mec...
Understanding the morphological changes of Pb-Sn solder alloys helps to improve their performance in...
A wide variety of phase evolution phenomena observed in solids such as intermetallic growth at the j...
A critical issue in the long-term reliability of solder connections used in electronic packages is t...
In microelectronic assemblies, the fatigue life of solder joints is a critical element of the overal...
This paper presents a quantitative simulation of the phase separation and coarsening phenomenon in e...
This paper presents a model, which is capable to simulate the coarsening process observed during the...
This paper presents a detailed numerical simulation of the coarsening phenomenon observed in microel...
AbstractSolders represent highly versatile and useful materials. They provide a broad range of techn...
The reliability of soldered connections is a very important issue in electronics industry. This proj...
This study is devoted to providing a mechanistic rationale of coarsening induced failure in solder a...
Microstructural length scales are relatively large in typical soldered connections. The microstructu...
Microstructural length scales are relatively largein typical soldered connections. A microstructure ...
In solder-copper diffusion couples an intermetallic compound layer forms when tin in the solder allo...
In solder-copper diffusion couples an intermetallic compound layer forms when tin in the solder allo...
A significant reliability concern with traditional lead-free solder alloys is the degradation of mec...
Understanding the morphological changes of Pb-Sn solder alloys helps to improve their performance in...
A wide variety of phase evolution phenomena observed in solids such as intermetallic growth at the j...
A critical issue in the long-term reliability of solder connections used in electronic packages is t...
In microelectronic assemblies, the fatigue life of solder joints is a critical element of the overal...