\u3cp\u3eA tactile probe has been designed at the Eindhoven University of Technology to measure a translation of its tip with a 3D uncertainty of 20 nm or better. The suspension of this probe and the electrical connections are manufactured in a series of etching and deposition steps and can be considered to be a Micro Electro-Mechanical System (MEMS). It will be shown that hysteresis effects can have a dominant influence on the probe measurement uncertainty. Several sources of hysteresis within the probe system are investigated experimentally.\u3c/p\u3
AbstractMeasuring probes are major components of coordinate measuring machines. They contribute to l...
本研究發展出高精度接觸式三維量測探頭,以懸浮片機構結合探針為基礎,搭配光學式位移感測器,測量探針接觸到工件後探球的三維位置變化。經精密儀器校正後,在行程20微米範圍內,各項性能之標準差皆在20奈米內。...
To achieve true 3D nano-measurement with sub-nanometer resolution and very low touch force through a...
A tactile probe has been designed at the Eindhoven University of Technology to measure a translation...
Measurement underpins manufacturing technology, or in more popular terms: when you cannot measure it...
When designing micro-scale tactile probes, a design trade-off must be made between the stiffness and...
Measurement instruments are sensitive to more than one physical quantity. When measuring work piece ...
Abstract: Probes are major components of coordinate measuring machines. They contribute to a large e...
AbstractIn micro tactile probing a design trade off must be made between stiff and robust probes. St...
In tactile micro coordinate metrology, miniature probing systems are required to allow geometric mea...
In 3D tactile micro-metrology the contamination of probing devices is a major problem that affects t...
When designing micro-scale tactile probes, a design trade-off must be made between the stiffness and...
Abstract: With the appearance of micromachined mechanical elements and nanotechnology, increased dem...
In the field of tactile surface probing, the contact point between the probing tip and the surface v...
Micro parts are increasingly found in a number of industrial products. They often have complex geome...
AbstractMeasuring probes are major components of coordinate measuring machines. They contribute to l...
本研究發展出高精度接觸式三維量測探頭,以懸浮片機構結合探針為基礎,搭配光學式位移感測器,測量探針接觸到工件後探球的三維位置變化。經精密儀器校正後,在行程20微米範圍內,各項性能之標準差皆在20奈米內。...
To achieve true 3D nano-measurement with sub-nanometer resolution and very low touch force through a...
A tactile probe has been designed at the Eindhoven University of Technology to measure a translation...
Measurement underpins manufacturing technology, or in more popular terms: when you cannot measure it...
When designing micro-scale tactile probes, a design trade-off must be made between the stiffness and...
Measurement instruments are sensitive to more than one physical quantity. When measuring work piece ...
Abstract: Probes are major components of coordinate measuring machines. They contribute to a large e...
AbstractIn micro tactile probing a design trade off must be made between stiff and robust probes. St...
In tactile micro coordinate metrology, miniature probing systems are required to allow geometric mea...
In 3D tactile micro-metrology the contamination of probing devices is a major problem that affects t...
When designing micro-scale tactile probes, a design trade-off must be made between the stiffness and...
Abstract: With the appearance of micromachined mechanical elements and nanotechnology, increased dem...
In the field of tactile surface probing, the contact point between the probing tip and the surface v...
Micro parts are increasingly found in a number of industrial products. They often have complex geome...
AbstractMeasuring probes are major components of coordinate measuring machines. They contribute to l...
本研究發展出高精度接觸式三維量測探頭,以懸浮片機構結合探針為基礎,搭配光學式位移感測器,測量探針接觸到工件後探球的三維位置變化。經精密儀器校正後,在行程20微米範圍內,各項性能之標準差皆在20奈米內。...
To achieve true 3D nano-measurement with sub-nanometer resolution and very low touch force through a...