Add to ORKGAdvances in semiconductor process and design technology enable the design of complex system chips. Traditional IC design in which every circuit is designed from scratch and reuse is limited to standard-cell libraries, is more and more replaced by a design style based on embedding large reusable modules, the so-called cores. This core-based design poses a series of new challenges, especially in the domains of manufacturing test and design validation and debug. This paper provides an overview of current industrial practices as well as academic research in these areas. We also discuss industry-wide efforts by VSIA and IEEE P1500 and describe the challenges for future research
Addresses the design challenges associated with generations of the semiconductor technology. This bo...
International audienceThe IEEE 1500 Standard for Embedded Core Testing proposes a flexible hardware t...
IC TESTING BASED on the full-scan design method-ology and its associated test methods, such as ATPG ...
Recently, designers have been embedding reusable modules to build on-chip systems that form rich lib...
[[abstract]]©2001 CIEE-With the advent of deep-submicron technologies, system-on-chip (SOC) designs,...
Integrated circuits are increasingly designed by embedding pre-designed reusable cores. IEEE P1500 S...
Core based design has become the de-facto design style for many VLSI design houses, as it facilitate...
Spurred by technology leading to the availability of millions of gates per chip, system-level integr...
Advances in the semiconductor process technology enable the creation of a complete system on one sin...
The complexity of modern digital circuit has increased enormously particularly in the context of par...
The main objective of core-based IC design is improvement of design efficiency and time-to-market. I...
Abstract — This tutorial responds to the rapidly increasing use of various cores for implementing sy...
Core-based design and reuse have been the key elements of efficient System-On-Chip (SoC) development...
In view of the recent paradigm shift from system-on-board to designs embracing embedded cores-based ...
Large single-die system chips are designed in a modular fashion, including and reusing pre-designed ...
Addresses the design challenges associated with generations of the semiconductor technology. This bo...
International audienceThe IEEE 1500 Standard for Embedded Core Testing proposes a flexible hardware t...
IC TESTING BASED on the full-scan design method-ology and its associated test methods, such as ATPG ...
Recently, designers have been embedding reusable modules to build on-chip systems that form rich lib...
[[abstract]]©2001 CIEE-With the advent of deep-submicron technologies, system-on-chip (SOC) designs,...
Integrated circuits are increasingly designed by embedding pre-designed reusable cores. IEEE P1500 S...
Core based design has become the de-facto design style for many VLSI design houses, as it facilitate...
Spurred by technology leading to the availability of millions of gates per chip, system-level integr...
Advances in the semiconductor process technology enable the creation of a complete system on one sin...
The complexity of modern digital circuit has increased enormously particularly in the context of par...
The main objective of core-based IC design is improvement of design efficiency and time-to-market. I...
Abstract — This tutorial responds to the rapidly increasing use of various cores for implementing sy...
Core-based design and reuse have been the key elements of efficient System-On-Chip (SoC) development...
In view of the recent paradigm shift from system-on-board to designs embracing embedded cores-based ...
Large single-die system chips are designed in a modular fashion, including and reusing pre-designed ...
Addresses the design challenges associated with generations of the semiconductor technology. This bo...
International audienceThe IEEE 1500 Standard for Embedded Core Testing proposes a flexible hardware t...
IC TESTING BASED on the full-scan design method-ology and its associated test methods, such as ATPG ...