International audienceThis paper is dedicated to the IEEE European Test Symposium (ETS). It offers an overview of all the European Test Workshop and Symposium events, from its first edition in 1996 to the next edition in 2020
Issues related to on-line testing are increasingly important in modern electronics systems. In parti...
The paper gives an overview of EdCrunch, the International Conference on New Educational Technologie...
The 17th edition of the IEEE International Conference on Environment and Electrical Engineering (EEE...
An evening panel session entitled Microelectronics and Test in 'The New Europe'--Challenges and Opp...
International audienceThis Special Section of IEEE Transactions on Device and Materials Reliability ...
International audienceThis document is a collection of the Work-in-Progress and Demo papers presente...
Vol. 30, Issue 1-2This Special Issue follows the 31st IFIP International Conference on Testing Softw...
International audienceTwenty-one years ago, the IEEE Mixed-Signal Test Workshop (IMSTW) was inaugura...
The highly successful lecture series on the topic of measurement and sensor technologies as part of ...
Issues related to on-line testing are increasingly important in modern electronics systems In partic...
The paper deals with a European experience of education in industrial test of ICs and SoCs using rem...
The 13 papers in this special section were originally presented at the 2008 International Conference...
International audienceProceedings of the 20th IEEE Latin American Test Symposium (LATS 2019) held 11...
International audienceThe IEEE IMWS is an initiative promoted by the IEEE MTT-S Members and Geograph...
The increased complexity of electronic systems has seen increasing reliability needs in various appl...
Issues related to on-line testing are increasingly important in modern electronics systems. In parti...
The paper gives an overview of EdCrunch, the International Conference on New Educational Technologie...
The 17th edition of the IEEE International Conference on Environment and Electrical Engineering (EEE...
An evening panel session entitled Microelectronics and Test in 'The New Europe'--Challenges and Opp...
International audienceThis Special Section of IEEE Transactions on Device and Materials Reliability ...
International audienceThis document is a collection of the Work-in-Progress and Demo papers presente...
Vol. 30, Issue 1-2This Special Issue follows the 31st IFIP International Conference on Testing Softw...
International audienceTwenty-one years ago, the IEEE Mixed-Signal Test Workshop (IMSTW) was inaugura...
The highly successful lecture series on the topic of measurement and sensor technologies as part of ...
Issues related to on-line testing are increasingly important in modern electronics systems In partic...
The paper deals with a European experience of education in industrial test of ICs and SoCs using rem...
The 13 papers in this special section were originally presented at the 2008 International Conference...
International audienceProceedings of the 20th IEEE Latin American Test Symposium (LATS 2019) held 11...
International audienceThe IEEE IMWS is an initiative promoted by the IEEE MTT-S Members and Geograph...
The increased complexity of electronic systems has seen increasing reliability needs in various appl...
Issues related to on-line testing are increasingly important in modern electronics systems. In parti...
The paper gives an overview of EdCrunch, the International Conference on New Educational Technologie...
The 17th edition of the IEEE International Conference on Environment and Electrical Engineering (EEE...
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