International audienceAn international round-robin experiment has been conducted to test procedures and methods for the measurement of angle-resolved light scattering. ASTM E2387-05 has been used as the main guide, while the experience gained should also contribute to the new ISO standard of angle-resolved scattering currently under development (ISO/WD 19986:2016). Seven laboratories from Europe and the United States measured the angle-resolved scattering from Al∕SiO 2-coated substrates, transparent substrates, volume diffusors, quasi-volume diffusors, white calibration standards, and grating samples at laser wavelengths in the UV, VIS, and NIR spectra. Results were sent to Fraunhofer IOF, which coordinated the experiments and analyzed the ...
The dynamic angle limited integrated scattering (DALIS) method has been developed to examine optical...
Driven by the increasing requirements for optical surfaces, components and systems, scattering techn...
Volume: 10330 Host publication title: Modeling Aspects in Optical Metrology VI Isbn(print): 978-1-51...
International audienceAn international round-robin experiment has been conducted to test procedures ...
An international round-robin experiment has been conducted among laboratories in different countries...
In every advanced optical system, light scattering caused by the imperfections of optical components...
Driven by the ever increasing requirements for optical surfaces, components and systems light increa...
The measurement of total scatter losses is a major prerequisite for the development, optimization an...
International audienceDue to the diversity and complexity of optical functions they address, optical...
We discuss principles of light scattering measurements: angle resolved scattering (ARS), total scatt...
Light scattering from interface imperfections or defects is a topic of persistent interest. On the o...
Light scattering metrology has become more and more important with the development of cutting-edge o...
An instrumentation for total and angle resolved scattering at 193 nm and 157 nm has been developed a...
QC 351 A7 no. 74Measurements of the scattering of reflected light as a function of angular separatio...
Light scattering measurements are important tools for characterizing optical surfaces can basically ...
The dynamic angle limited integrated scattering (DALIS) method has been developed to examine optical...
Driven by the increasing requirements for optical surfaces, components and systems, scattering techn...
Volume: 10330 Host publication title: Modeling Aspects in Optical Metrology VI Isbn(print): 978-1-51...
International audienceAn international round-robin experiment has been conducted to test procedures ...
An international round-robin experiment has been conducted among laboratories in different countries...
In every advanced optical system, light scattering caused by the imperfections of optical components...
Driven by the ever increasing requirements for optical surfaces, components and systems light increa...
The measurement of total scatter losses is a major prerequisite for the development, optimization an...
International audienceDue to the diversity and complexity of optical functions they address, optical...
We discuss principles of light scattering measurements: angle resolved scattering (ARS), total scatt...
Light scattering from interface imperfections or defects is a topic of persistent interest. On the o...
Light scattering metrology has become more and more important with the development of cutting-edge o...
An instrumentation for total and angle resolved scattering at 193 nm and 157 nm has been developed a...
QC 351 A7 no. 74Measurements of the scattering of reflected light as a function of angular separatio...
Light scattering measurements are important tools for characterizing optical surfaces can basically ...
The dynamic angle limited integrated scattering (DALIS) method has been developed to examine optical...
Driven by the increasing requirements for optical surfaces, components and systems, scattering techn...
Volume: 10330 Host publication title: Modeling Aspects in Optical Metrology VI Isbn(print): 978-1-51...