The study of the effects of neutrons induced errors in Commercial Off The Shelf (COTS) components is becoming increasingly important for terrestrial and avionics applications as their potential impact in terms of reliability and safety could be catastrophic. This paper describes the setup and the experimental analysis of neutron irradiation tests performed at the Rutherford Appleton Laboratories (ISIS) neutron accelerator on the NEMESYS (Neutron Effects on MEmory SYStems) platform, a project which has the goal of studying the effects of atmospheric neutrons on COTS components during the stratospheric flight of a balloon. The results of bit upsets on the COTS SRAM and COTS Camera obtained from the tests are discussed and correlated together ...
Radiation tests with 15-MeV neutrons were performed in a COTS SRAM including a new memory cell desig...
Cette thèse s’intéresse aux effets des particules présentent naturellement dans l’atmosphère. L'étud...
IEEE Catalog Number: CFP15449-ART (XPLORE) ISBN: 978-1-5090-0232-0 (XPLORE) IEEE Catalog Number: CFP...
The study of the effects of neutrons induced errors in Commercial Off The Shelf (COTS) components is...
This study analyses the response of synchronous dynamic random access memories to neutron irradiatio...
Neutrons may produce charged particles, which can affect modern electronic components. Depending on ...
Cosmic neutron radiation in the atmosphere is a harsh environment for modern aircraft electronics. ...
This paper presents a neutron accelerated study of soft errors in advanced electronic devices used i...
This paper describes a single-event upset experiment performed at the Los Alamos National Laboratory...
International audienceRadiation tests with 15-MeV neutrons were performed in a COTS SRAM including a...
The NASA Cooperative Agreement NAG4-210 was granted under the FY2000 Faculty Awards for Research (FA...
This paper quantifies the phenomena observed during a Single Event Upset (SEU) test performed on a r...
This proposal outlines the case for ISIS to design and build an instrument station for accelerated a...
Single event upset (SEU) is mainly caused by neutrons in the terrestrial environment. In addition, S...
Electronic systems in space and terrestrial environments are subjected to a flow of particles of nat...
Radiation tests with 15-MeV neutrons were performed in a COTS SRAM including a new memory cell desig...
Cette thèse s’intéresse aux effets des particules présentent naturellement dans l’atmosphère. L'étud...
IEEE Catalog Number: CFP15449-ART (XPLORE) ISBN: 978-1-5090-0232-0 (XPLORE) IEEE Catalog Number: CFP...
The study of the effects of neutrons induced errors in Commercial Off The Shelf (COTS) components is...
This study analyses the response of synchronous dynamic random access memories to neutron irradiatio...
Neutrons may produce charged particles, which can affect modern electronic components. Depending on ...
Cosmic neutron radiation in the atmosphere is a harsh environment for modern aircraft electronics. ...
This paper presents a neutron accelerated study of soft errors in advanced electronic devices used i...
This paper describes a single-event upset experiment performed at the Los Alamos National Laboratory...
International audienceRadiation tests with 15-MeV neutrons were performed in a COTS SRAM including a...
The NASA Cooperative Agreement NAG4-210 was granted under the FY2000 Faculty Awards for Research (FA...
This paper quantifies the phenomena observed during a Single Event Upset (SEU) test performed on a r...
This proposal outlines the case for ISIS to design and build an instrument station for accelerated a...
Single event upset (SEU) is mainly caused by neutrons in the terrestrial environment. In addition, S...
Electronic systems in space and terrestrial environments are subjected to a flow of particles of nat...
Radiation tests with 15-MeV neutrons were performed in a COTS SRAM including a new memory cell desig...
Cette thèse s’intéresse aux effets des particules présentent naturellement dans l’atmosphère. L'étud...
IEEE Catalog Number: CFP15449-ART (XPLORE) ISBN: 978-1-5090-0232-0 (XPLORE) IEEE Catalog Number: CFP...