Cache memories are very relevant components in modern processors, and therefore, their protection against soft errors is important to ensure reliability. One important element in caches is the tag fields, which are critical to keep data integrity and achieve a high hit ratio. To protect them against soft errors, a parity bit or a single error correction (SEC) code is commonly used. In that case, on each cache access, the parity bit is checked or the SEC code decoded on each cache way to detect and correct errors. In this paper, FastTag, a novel approach to protect cache tags is presented and evaluated. The proposed scheme computes the parity or SEC bits on the incoming address and compares the result with the tag and parity bits stored in e...
Continuous technology scaling has brought us to a point, where transistors have become extremely sus...
In current processors, the cache controller, which contains the cache directory and other logic such...
Abstract—With advances in process technology, soft errors are becoming an increasingly critical desi...
Cache memories are very relevant components in modern processors, and therefore, their protection ag...
AbstractCache memories serve as accelerators to improve the performance of modern microprocessors. C...
Technology scaling leads to burn-in phase out and increasing post-silicon test complexity, which inc...
The problem of soft errors caused by radiation events are expected to get worse with technology scal...
Cache memory is a fundamental component of all modern microprocessors. Caches provide for efficient ...
The problem of soft errors caused by radiation events are expected to get worse with technology scal...
Content Addressable Memories (CAM) are widely used for the tag portions in highly associative caches...
Cache memory is a fundamental component of all modern microprocessors. Caches provide for efficient ...
As emerging memories are utilized in processors as main memory, they must also coexist with CMOS mem...
This work proposes an SRAM array with built-in real-time error detection (RTD) capabilities. Each ce...
For an electronic product or chip if functional faults exist, then the product or chip is of no use....
Low voltage operation and small device sizes reduce the critical charge stored in a SRAM cell making...
Continuous technology scaling has brought us to a point, where transistors have become extremely sus...
In current processors, the cache controller, which contains the cache directory and other logic such...
Abstract—With advances in process technology, soft errors are becoming an increasingly critical desi...
Cache memories are very relevant components in modern processors, and therefore, their protection ag...
AbstractCache memories serve as accelerators to improve the performance of modern microprocessors. C...
Technology scaling leads to burn-in phase out and increasing post-silicon test complexity, which inc...
The problem of soft errors caused by radiation events are expected to get worse with technology scal...
Cache memory is a fundamental component of all modern microprocessors. Caches provide for efficient ...
The problem of soft errors caused by radiation events are expected to get worse with technology scal...
Content Addressable Memories (CAM) are widely used for the tag portions in highly associative caches...
Cache memory is a fundamental component of all modern microprocessors. Caches provide for efficient ...
As emerging memories are utilized in processors as main memory, they must also coexist with CMOS mem...
This work proposes an SRAM array with built-in real-time error detection (RTD) capabilities. Each ce...
For an electronic product or chip if functional faults exist, then the product or chip is of no use....
Low voltage operation and small device sizes reduce the critical charge stored in a SRAM cell making...
Continuous technology scaling has brought us to a point, where transistors have become extremely sus...
In current processors, the cache controller, which contains the cache directory and other logic such...
Abstract—With advances in process technology, soft errors are becoming an increasingly critical desi...