We examine the structure and the evolution of Ge islands epitaxially grown on vicinal Si(111) 6 surfaces by scanning tunneling microscopy. Contrary to what is observed on the singular surface, 7 three-dimensional Ge nanoislands form directly through the elastic relaxation of step-edge 8 protrusions during the unstable step-flow growth. As the substrate misorientation is increased, the 9 islands undergo a shape transformation which is driven by surface energy minimization and 10 controlled by the miscut angle. Using finite element simulations, we show that the dynamics of 11 islanding observed in the experiment results from the anisotropy of the strain relaxation. VC 2011 12 American Institute of Physics. [doi:10.1063/1.3655906
We have followed the evolution of strained Ge/Si(111) Stranski-Krastanov islands by atomic force and...
We have followed by scanning tunneling microscopy (STM) the growth of thin Ge films obtained by reac...
A complete description of Ge growth on vicinal Si(001) surfaces is provided. The distinctive mechani...
We examine the structure and the evolution of Ge islands epitaxially grown on vicinal Si(111) 6 sur...
We examine the structure and the evolution of Ge islands epitaxially grown on vicinal Si(111) 6 sur...
We examine the structure and the evolution of Ge islands epitaxially grown on vicinal Si(111) surfac...
We examine the structure and the evolution of Ge islands epitaxially grown on vicinal Si(111) surfac...
A complete description of Ge growth on vicinal Si(001) surfaces is provided. The distinctive mechani...
A complete description of Ge growth on vicinal Si(001) surfaces is provided. The distinctive mechani...
A complete description of Ge growth on vicinal Si(001) surfaces in the angular miscut range 0°-8° is...
A complete description of Ge growth on vicinal Si(001) surfaces in the angular miscut range 0 –8 is...
A complete description of Ge growth on vicinal Si(001) surfaces in the angular miscut range 0 –8 is...
A complete description of Ge growth on vicinal Si(001) surfaces in the angular miscut range 0 –8 is...
A complete description of Ge growth on vicinal Si(001) surfaces in the angular miscut range 0 –8 is...
A complete description of Ge growth on vicinal Si(001) surfaces in the angular miscut range 0 –8 is...
We have followed the evolution of strained Ge/Si(111) Stranski-Krastanov islands by atomic force and...
We have followed by scanning tunneling microscopy (STM) the growth of thin Ge films obtained by reac...
A complete description of Ge growth on vicinal Si(001) surfaces is provided. The distinctive mechani...
We examine the structure and the evolution of Ge islands epitaxially grown on vicinal Si(111) 6 sur...
We examine the structure and the evolution of Ge islands epitaxially grown on vicinal Si(111) 6 sur...
We examine the structure and the evolution of Ge islands epitaxially grown on vicinal Si(111) surfac...
We examine the structure and the evolution of Ge islands epitaxially grown on vicinal Si(111) surfac...
A complete description of Ge growth on vicinal Si(001) surfaces is provided. The distinctive mechani...
A complete description of Ge growth on vicinal Si(001) surfaces is provided. The distinctive mechani...
A complete description of Ge growth on vicinal Si(001) surfaces in the angular miscut range 0°-8° is...
A complete description of Ge growth on vicinal Si(001) surfaces in the angular miscut range 0 –8 is...
A complete description of Ge growth on vicinal Si(001) surfaces in the angular miscut range 0 –8 is...
A complete description of Ge growth on vicinal Si(001) surfaces in the angular miscut range 0 –8 is...
A complete description of Ge growth on vicinal Si(001) surfaces in the angular miscut range 0 –8 is...
A complete description of Ge growth on vicinal Si(001) surfaces in the angular miscut range 0 –8 is...
We have followed the evolution of strained Ge/Si(111) Stranski-Krastanov islands by atomic force and...
We have followed by scanning tunneling microscopy (STM) the growth of thin Ge films obtained by reac...
A complete description of Ge growth on vicinal Si(001) surfaces is provided. The distinctive mechani...