In this paper an innovative fault tolerant solid state mass memory (FTSSMM) architecture is described. Solid state mass memories (SSMMs) are particularly suitable for space applications and more in general for harsh environments such us, for example, nuclear accelerators or avionics. The presented FTSSMM design has been entirely based on commercial off the shelf (COTS) components. In fact, cost competitive and very high performance SSMMs cannot be easily implemented by using space qualified components, due the technological gap and very high cost characterizing these components. In order to match the severe reliability requirements of space applications a COTS-based apparatus must be designed by using suitable system level methodologies [1,...
This letter proposes a classification algorithm to discriminate between recoverable and not recovera...
Part I. Correction of Cell Defects in Integrated Memories: This paper introduces two schemes to corr...
New memory technologies and processes introduce new defects that cause previously unknown faults. Dy...
In this paper an innovative fault tolerant solid state mass memory (FTSSMM) architecture is describe...
—This paper describes a novel architecture of fault tolerant Solid State Mass Memory (SSMM) for sat...
The use of Commercial Off The Shelf (COTS) devices for space applications is growing due the higher ...
This paper presents the techniques for improving system reliability which SEAKR Engineering employs ...
Recent advances in microelectronics industry allow us to create a System-On-Chip. The embedded memor...
Scaling of transistor's channel length is entering the realm of atomic and molecular geometries maki...
This paper comparatively analyzes the static random-access memory (SRAM) cell designs for fault tole...
As memory technology scales, the demand for higher performance and reliable operation is increasing ...
Advances in spaceborne vehicular technology have made possible the long-life duration of the mission...
There has been a rising demand for well-organized and reliable digital storage as well as transmissi...
Summarization: This paper proposes a novel SRAM based FPGA architecture that is suitable for mapping...
UnrestrictedWith aggressive technology scaling, radiation-induced soft errors have become a major th...
This letter proposes a classification algorithm to discriminate between recoverable and not recovera...
Part I. Correction of Cell Defects in Integrated Memories: This paper introduces two schemes to corr...
New memory technologies and processes introduce new defects that cause previously unknown faults. Dy...
In this paper an innovative fault tolerant solid state mass memory (FTSSMM) architecture is describe...
—This paper describes a novel architecture of fault tolerant Solid State Mass Memory (SSMM) for sat...
The use of Commercial Off The Shelf (COTS) devices for space applications is growing due the higher ...
This paper presents the techniques for improving system reliability which SEAKR Engineering employs ...
Recent advances in microelectronics industry allow us to create a System-On-Chip. The embedded memor...
Scaling of transistor's channel length is entering the realm of atomic and molecular geometries maki...
This paper comparatively analyzes the static random-access memory (SRAM) cell designs for fault tole...
As memory technology scales, the demand for higher performance and reliable operation is increasing ...
Advances in spaceborne vehicular technology have made possible the long-life duration of the mission...
There has been a rising demand for well-organized and reliable digital storage as well as transmissi...
Summarization: This paper proposes a novel SRAM based FPGA architecture that is suitable for mapping...
UnrestrictedWith aggressive technology scaling, radiation-induced soft errors have become a major th...
This letter proposes a classification algorithm to discriminate between recoverable and not recovera...
Part I. Correction of Cell Defects in Integrated Memories: This paper introduces two schemes to corr...
New memory technologies and processes introduce new defects that cause previously unknown faults. Dy...