We present an impression of the present state of knowledge on the formation, via a modified Stransky-Krastanov growth mode, of InAs Quantum Dots (QD) on GaAs substrates. In order to fulfil this requirement, we have grown by MBE a single sample with gradient coverage and its analyses being performed by means of atomic force microscopy. © 2007 IEEE
We have investigated, by means of atomic force microscopy, the complete evolution of InAs/GaAs(001) ...
Cross-sectional scanning-tunneling microscopy (X-STM) has been used to study the formation of self-a...
We have investigated by atomic force microscopy subsequent stages of the heteroepitaxy of InAs on Ga...
We present an impression of the present state of knowledge on the formation, via a modified Stransky...
Dynamic images of InAs quantum dots (QDs) formation are obtained using a unique scanning tunneling m...
We have analysed by atomic force microscopy the InAs on GaAs(001) system prepared by molecular beam ...
The formation process of InAs quantum dots (QDs) on vicinal GaAs (1 0 0) substrates is studied by at...
We have followed by Atomic Force Microscopy (AFM) the epitaxial growth of InAs on GaAs(001) starting...
We have investigated, by means of atomic force microscopy, the complete evolution of InAs/GaAs(001) ...
Cross-sectional scanning-tunneling microscopy (X-STM) has been used to study the formation of self-a...
We have investigated by atomic force microscopy subsequent stages of the heteroepitaxy of InAs on Ga...
We present an impression of the present state of knowledge on the formation, via a modified Stransky...
Dynamic images of InAs quantum dots (QDs) formation are obtained using a unique scanning tunneling m...
We have analysed by atomic force microscopy the InAs on GaAs(001) system prepared by molecular beam ...
The formation process of InAs quantum dots (QDs) on vicinal GaAs (1 0 0) substrates is studied by at...
We have followed by Atomic Force Microscopy (AFM) the epitaxial growth of InAs on GaAs(001) starting...
We have investigated, by means of atomic force microscopy, the complete evolution of InAs/GaAs(001) ...
Cross-sectional scanning-tunneling microscopy (X-STM) has been used to study the formation of self-a...
We have investigated by atomic force microscopy subsequent stages of the heteroepitaxy of InAs on Ga...