This paper reports on the interfacial reactions and lifetime of electroless Ni-P coatings in contact with molten Sn-Bi based solders. A layer of approximately 4 m thick electroless Ni-P in contact with the molten Sn-58Bi solder began to fail at 48 h at temperatures between 200 C and 240 C. Elemental additions to modify the solder, included 1–2wt.% of Al, Cr, Si, Zn, Ag, Au, Ru, Ti, Pt, Nb, and Cu. Of these, only Cu modified the interfacial intermetallic compound growth from Ni3Sn4 to (Cu,Ni)6Sn5, resulting in significantly decreased consumption rates of the Ni-P substrate in contact with the molten solder and increasing the lifetime of the Ni-P layer to between 430 and 716 h. Micro cracks were observed in all but the thinnest Ni-P layers, a...
Effect of electromigration on interfacial reactions between electroless Ni–P (EL-Ni) and eutectic Sn...
Abstract The interface between the solder and the under-bump metallization (UBM) affect the reliabil...
The Sn-3.5Ag and Sn-4.0Ag-0.5Cu solders on Au/electroless Ni(P) metallization exhibited different in...
Liquid solder interconnects are promising as an alternative approach to conventional high melting po...
The stability of Ni3P and its effect on the reaction with molten tin were evaluated in the present s...
The control of the interfacial reaction rate is of great importance for liquid solder interconnects ...
A comparative study of the reaction characteristics between molten tin and both as-plated and heat-t...
Two key technologies used by the electronics industry are chip technology and packaging technology. ...
[[abstract]]Electroless Ni-P (EN) has been popularly adopted and used as a diffusion barrier in the ...
Electroless Ni-P plating has been a good candidate for Under Bump Metallization (UBM) in IC packagin...
[[abstract]]The Ni-based under-bump metallurgies (UBMs) are of interest because they have a slower r...
[[abstract]]In the present study, several under bump metallization (UBM) schemes using either electr...
In the present study electroless Ni-Sn-P (6-7 wt.% P and 19-21 wt.% Sn) coating was prepared on copp...
The interfacial microstructure of electroless Ni-P/Sn-3.5Ag solder joints was investigated after ref...
Solid-state interfacial reactions between Sn–3.5Ag solder and electroless Ni–P metallization on Cu s...
Effect of electromigration on interfacial reactions between electroless Ni–P (EL-Ni) and eutectic Sn...
Abstract The interface between the solder and the under-bump metallization (UBM) affect the reliabil...
The Sn-3.5Ag and Sn-4.0Ag-0.5Cu solders on Au/electroless Ni(P) metallization exhibited different in...
Liquid solder interconnects are promising as an alternative approach to conventional high melting po...
The stability of Ni3P and its effect on the reaction with molten tin were evaluated in the present s...
The control of the interfacial reaction rate is of great importance for liquid solder interconnects ...
A comparative study of the reaction characteristics between molten tin and both as-plated and heat-t...
Two key technologies used by the electronics industry are chip technology and packaging technology. ...
[[abstract]]Electroless Ni-P (EN) has been popularly adopted and used as a diffusion barrier in the ...
Electroless Ni-P plating has been a good candidate for Under Bump Metallization (UBM) in IC packagin...
[[abstract]]The Ni-based under-bump metallurgies (UBMs) are of interest because they have a slower r...
[[abstract]]In the present study, several under bump metallization (UBM) schemes using either electr...
In the present study electroless Ni-Sn-P (6-7 wt.% P and 19-21 wt.% Sn) coating was prepared on copp...
The interfacial microstructure of electroless Ni-P/Sn-3.5Ag solder joints was investigated after ref...
Solid-state interfacial reactions between Sn–3.5Ag solder and electroless Ni–P metallization on Cu s...
Effect of electromigration on interfacial reactions between electroless Ni–P (EL-Ni) and eutectic Sn...
Abstract The interface between the solder and the under-bump metallization (UBM) affect the reliabil...
The Sn-3.5Ag and Sn-4.0Ag-0.5Cu solders on Au/electroless Ni(P) metallization exhibited different in...