Add to ORKGA transient photovoltage decay (TPVD) measurement system is currently being developed at CREST and measurements were conducted on several CdTe solar cells. The extracted effective carrier lifetimes were around 100ns. The effect of external illumination biasing was investigated and was found to reduce the effect of junction capacitance and saturate trap states in the devices. This resulted in shorter extracted effective carrier lifetimes. Increasing the illumination of the pulsed-laser intensity also increased the effective carrier lifetime
This paper presents experiment measurements of minority carrier lifetime using three different metho...
Global energy consumption has been continuously rising every year, and especially in the past decade...
NREL study may provide future guidance in improving CdS/CdTe photovoltaic device performance. The ma...
A transient photovoltage decay (TPVD) measurement system is currently being developed at CREST and m...
This work presents the development of a measurement system which combines optical and electrical cha...
This thesis presents a novel method to quantify the localised carrier collection efficiency of thin ...
This work presents the use of a combined measurement system for spectrally-resolved photoluminescenc...
Transient photovoltage (TPV) measurements are frequently used to study recombination processes in th...
Carrier lifetime measurements from the short-circuit photocurrent i(t) decay and both the decay and ...
Transient photovoltage (TPV) is a technique frequently used to determine charge carrier lifetimes in...
In this work single junction a-Si, CdTe and CIGS modules and prototype modules and mini-modules were...
Transient photovoltage (TPV) measurements are frequently used to study recombination processes in th...
Transient photoluminescence (TPL) and transient photovoltage (TPV) measurements are important and fr...
Lifetime spectroscopy is a valuable tool for the characterization of PV materials. This paper combin...
When the diffusion length of minority carriers becomes comparable with or larger than the thickness ...
This paper presents experiment measurements of minority carrier lifetime using three different metho...
Global energy consumption has been continuously rising every year, and especially in the past decade...
NREL study may provide future guidance in improving CdS/CdTe photovoltaic device performance. The ma...
A transient photovoltage decay (TPVD) measurement system is currently being developed at CREST and m...
This work presents the development of a measurement system which combines optical and electrical cha...
This thesis presents a novel method to quantify the localised carrier collection efficiency of thin ...
This work presents the use of a combined measurement system for spectrally-resolved photoluminescenc...
Transient photovoltage (TPV) measurements are frequently used to study recombination processes in th...
Carrier lifetime measurements from the short-circuit photocurrent i(t) decay and both the decay and ...
Transient photovoltage (TPV) is a technique frequently used to determine charge carrier lifetimes in...
In this work single junction a-Si, CdTe and CIGS modules and prototype modules and mini-modules were...
Transient photovoltage (TPV) measurements are frequently used to study recombination processes in th...
Transient photoluminescence (TPL) and transient photovoltage (TPV) measurements are important and fr...
Lifetime spectroscopy is a valuable tool for the characterization of PV materials. This paper combin...
When the diffusion length of minority carriers becomes comparable with or larger than the thickness ...
This paper presents experiment measurements of minority carrier lifetime using three different metho...
Global energy consumption has been continuously rising every year, and especially in the past decade...
NREL study may provide future guidance in improving CdS/CdTe photovoltaic device performance. The ma...