A novel method to improve the spatial resolution of microwave radiometer measurements using variable exponent Lebesgue space

Spatial resolution enhancement of microwave radiometer measurements is addressed using a new method that is based on an Lp penalisation approach with a variable p exponent. The key idea is letting p to vary in the range 1.2 - 2 to take benefit of both Hilbert (i.e. p=2) and Banach (i.e. p=1.2) advantages. Results, obtained processing both simulated and actual Special Sensor Microwave Imager (SSM/I) measurements, demonstrate the benefits of the proposed approach in reconstructing abrupt discontinuities and smooth gradients with respect to approaches in Hilbert and Banach spaces