During the past two decades instrumentation in scanning transmission electron microscopy (STEM) has pushed toward higher intensity electron probes to increase the signal-to-noise ratio of recorded images. While this is suitable for robust specimens, biological specimens require a much reduced electron dose for high-resolution imaging. We describe here protocols for low-dose STEM image recording with a conventional field-emission gun STEM, while maintaining the high-resolution capability of the instrument. Our findings show that a combination of reduced pixel dwell time and reduced gun current can achieve radiation doses comparable to low-dose TEM
A low beam intensity, low electron dose imaging method has been developed for single-particle electr...
A low beam intensity, low electron dose imaging method has been developed for single-particle electr...
© 2017 Dr. Hamish Galloway BrownScanning transmission electron microscopy (STEM) is capable of imagi...
Examination of thin samples in TEM or STEM has been performed at hundreds of keV. This energy range ...
While aberration correction for scanning transmission electron microscopes (STEMs) dramatically incr...
Electron radiation damage is an important topic in electron microscopy. A large proportion of materi...
Electron radiation damage is an important topic in electron microscopy. A large proportion of materi...
We demonstrate the ability to record a tomographic tilt series containing 3487 images in only 3.5 s ...
Imaging of thick, low contrast biological structures is hampered by chromatic aberration introduced ...
htmlabstractWe demonstrate the ability to record a tomographic tilt series containing 3487 images in...
Low voltage transmission electron microscopy (<=80 kV) has many applications in imaging beam-sensiti...
Low electron dose observation is indispensable for observing various samples using a transmission el...
A scanning transmission electron microscope (STEM) is useful device combining features of scanning a...
Scanning transmission electron microscopy (STEM) provides structural analysis with sub-angstrom reso...
Sub-sampling during image acquisition in scanning transmission electron microscopy (STEM) has been s...
A low beam intensity, low electron dose imaging method has been developed for single-particle electr...
A low beam intensity, low electron dose imaging method has been developed for single-particle electr...
© 2017 Dr. Hamish Galloway BrownScanning transmission electron microscopy (STEM) is capable of imagi...
Examination of thin samples in TEM or STEM has been performed at hundreds of keV. This energy range ...
While aberration correction for scanning transmission electron microscopes (STEMs) dramatically incr...
Electron radiation damage is an important topic in electron microscopy. A large proportion of materi...
Electron radiation damage is an important topic in electron microscopy. A large proportion of materi...
We demonstrate the ability to record a tomographic tilt series containing 3487 images in only 3.5 s ...
Imaging of thick, low contrast biological structures is hampered by chromatic aberration introduced ...
htmlabstractWe demonstrate the ability to record a tomographic tilt series containing 3487 images in...
Low voltage transmission electron microscopy (<=80 kV) has many applications in imaging beam-sensiti...
Low electron dose observation is indispensable for observing various samples using a transmission el...
A scanning transmission electron microscope (STEM) is useful device combining features of scanning a...
Scanning transmission electron microscopy (STEM) provides structural analysis with sub-angstrom reso...
Sub-sampling during image acquisition in scanning transmission electron microscopy (STEM) has been s...
A low beam intensity, low electron dose imaging method has been developed for single-particle electr...
A low beam intensity, low electron dose imaging method has been developed for single-particle electr...
© 2017 Dr. Hamish Galloway BrownScanning transmission electron microscopy (STEM) is capable of imagi...