Scattering-parameters (S-parameters) are important to be evaluated in order to ascertain the hardware prototype can be designed according to the specifications. Various calibration methods have been applied to the network analyser to obtain the S-parameters, such as shortopen- load-thru (SOLT) and thru-reflect-line (TRL). Substrate integrated waveguide (SIW) demonstrates low loss, compact size, and ease for integration with the planar circuits. In this research, MTRL calibration is proposed to predict the single- and multilayer- SIW. The analytical modelling of MTRL calibration, and the FE models of the prototypes are discussed and simulated. The S-parameters, such as insertion loss, bandwidth, and resonant frequency, can be measure...
The technological downscaling has improved the figures of merit of silicon-based technology, enablin...
This paper describes a single flange 2-port measurement setup for S-parameter characterization of wa...
This paper describes the scattering parameters magnitude measurement and uncertainty comparison usi...
Tremendous development in wireless mobile communication and microwave measurement increase the deman...
One of the main problems when exciting or measuring substrate integrated waveguide (SIW) devices lie...
This technical report describes the uncertainty assessment on scattering parameter measurements obta...
We present a sensitivity analysis on TRL calibrated S-parameter measurements of membrane circuits in...
The calibration and measurement problem at millimeter-wave frequencies of planar devices and MMICs i...
We present a sensitivity analysis on TRL calibrated S-parameter measurements of membrane circuits in...
The quality of calibration standards in on-wafer measurements has a strong impact on the accuracy of...
One of the main problems when exciting or measuring substrate integrated waveguide (SIW) devices lie...
In past years, a great number of substrate integrated circuits have been developed. Among these new ...
In this thesis, a thru-reflect-line (TRL) calibration technique enabling full S-parameter characteri...
An improved Short-Open-Load-Thru (SOLT) on-wafer vector network calibration method for broad-band ac...
International audienceIn this paper, we present on-wafer S-parameter measurement of test structures ...
The technological downscaling has improved the figures of merit of silicon-based technology, enablin...
This paper describes a single flange 2-port measurement setup for S-parameter characterization of wa...
This paper describes the scattering parameters magnitude measurement and uncertainty comparison usi...
Tremendous development in wireless mobile communication and microwave measurement increase the deman...
One of the main problems when exciting or measuring substrate integrated waveguide (SIW) devices lie...
This technical report describes the uncertainty assessment on scattering parameter measurements obta...
We present a sensitivity analysis on TRL calibrated S-parameter measurements of membrane circuits in...
The calibration and measurement problem at millimeter-wave frequencies of planar devices and MMICs i...
We present a sensitivity analysis on TRL calibrated S-parameter measurements of membrane circuits in...
The quality of calibration standards in on-wafer measurements has a strong impact on the accuracy of...
One of the main problems when exciting or measuring substrate integrated waveguide (SIW) devices lie...
In past years, a great number of substrate integrated circuits have been developed. Among these new ...
In this thesis, a thru-reflect-line (TRL) calibration technique enabling full S-parameter characteri...
An improved Short-Open-Load-Thru (SOLT) on-wafer vector network calibration method for broad-band ac...
International audienceIn this paper, we present on-wafer S-parameter measurement of test structures ...
The technological downscaling has improved the figures of merit of silicon-based technology, enablin...
This paper describes a single flange 2-port measurement setup for S-parameter characterization of wa...
This paper describes the scattering parameters magnitude measurement and uncertainty comparison usi...