A two-port coaxial probe is introduced to nondestructively determine the permittivity tensor of a uniaxial material. The proposed approach possesses several advantages over existing techniques, e.g., only a single sample is required, the sample does not need to be rotated, and only a single measurement system is needed. The derivation of the theoretical scattering parameters is shown. This is accomplished by applying Love\u27s equivalence theorem and the continuity of transverse magnetic fields to formulate a system of coupled integral equations. A necessary step in this approach is the derivation of the magnetic-current-excited uniaxial parallel-plate Green\u27s function. The development of this Green\u27s function is presented here using ...
This paper is focused on the non-destructive measurement of the dielectric constants (relative permi...
[[abstract]]A full-wave analysis is applied to the scheme of measuring electromagnetic (EM) properti...
Techniques based on fixture probes in reflection are used in microwave reflectometry as a novel dia...
A novel one-port probe technique, which combines the measurements of a rectangular waveguide and coa...
A two-layer dual-waveguide probe measurement geometry is proposed to nondestructively measure the co...
Abstract. This paper describes and evaluates a method for determining complex permittivity, and pres...
This paper describes and evaluates a method for determining complex permittivity, and presents resul...
This paper describes a novel permittivity measurement technique using dual open ended coaxial sensor...
In this dissertation, a method for the simultaneous non-destructive extraction of the permittivity a...
This research uses monostatic far-zone scattered field measurements to estimate the permittivity of ...
Abstract The measurement of the dielectric properties of materials has been applied in non-destructi...
A nondestructive technique for determining the complex permittivity and permeability of a perfect el...
The measurement of the dielectric properties of materials has been applied in non-destructive tests,...
As the use of anisotropic materials in electromagnetic applications continues to proliferate, it bec...
This paper is focused on the non-destructive measurement of the dielectric constants (relative permi...
This paper is focused on the non-destructive measurement of the dielectric constants (relative permi...
[[abstract]]A full-wave analysis is applied to the scheme of measuring electromagnetic (EM) properti...
Techniques based on fixture probes in reflection are used in microwave reflectometry as a novel dia...
A novel one-port probe technique, which combines the measurements of a rectangular waveguide and coa...
A two-layer dual-waveguide probe measurement geometry is proposed to nondestructively measure the co...
Abstract. This paper describes and evaluates a method for determining complex permittivity, and pres...
This paper describes and evaluates a method for determining complex permittivity, and presents resul...
This paper describes a novel permittivity measurement technique using dual open ended coaxial sensor...
In this dissertation, a method for the simultaneous non-destructive extraction of the permittivity a...
This research uses monostatic far-zone scattered field measurements to estimate the permittivity of ...
Abstract The measurement of the dielectric properties of materials has been applied in non-destructi...
A nondestructive technique for determining the complex permittivity and permeability of a perfect el...
The measurement of the dielectric properties of materials has been applied in non-destructive tests,...
As the use of anisotropic materials in electromagnetic applications continues to proliferate, it bec...
This paper is focused on the non-destructive measurement of the dielectric constants (relative permi...
This paper is focused on the non-destructive measurement of the dielectric constants (relative permi...
[[abstract]]A full-wave analysis is applied to the scheme of measuring electromagnetic (EM) properti...
Techniques based on fixture probes in reflection are used in microwave reflectometry as a novel dia...