© 2019 IEEE. In this study, we perform measurements of electromagnetic emanations from a printed circuit board in the near field on the basis of the IEC-61967-3 international standard. In this standard, engineers use a special measurement system that allows implementing a planar method for scanning electromagnetic emanation. The advantage of this approach is higher measurement accuracy. For these reasons, planar scanning method becomes the most popular. However, in this approach it is necessary to take into account various kinds of effects that affect the original radiation. In this paper, we give estimates of the influence of various factors on the original radiation from a printed circuit board in the near field
Characterization of electromagnetic emissions from printed circuit boards (PCBs) is an important iss...
The paper presents an efficient methodology to characterize electromagnetic disturbances radiated fr...
Based on measurements from a near-field scanner and far-field measurements obtained in a semi-anecho...
© 2019 IEEE. In this study, we perform measurements of electromagnetic emanations from a printed cir...
The paper presents a measurement system for the evaluation of the electromagnetic emissions radiated...
© 2017 IEEE. in this paper we propose a technique for estimating the electromagnetic radiation from ...
The radiated electromagnetic (EM) field emissions from a printed circuit board (PCB) are here dealt ...
International audienceIn this article, we present a study on the measurement of the electromagnetic ...
International audienceThis paper aims at studying the near field measurement method in immunity to i...
Abstract—With the increases of the module integration density and complexity in electrical and power...
Near-field scanning has often been used to measure and characterize magnetic fields surrounding indi...
International audienceThe work presented in this two-part paper focuses on a prediction method of th...
Near-field scan on a Huygens\u27 box can be used in order to predict the maximal radiated emission f...
Abstract- I-Characterization of electromagnetic emissions from printed circuit boards (PCBs) is an i...
International audienceNear-Field Scan Immunity is a powerful technique to identify the root-cause of...
Characterization of electromagnetic emissions from printed circuit boards (PCBs) is an important iss...
The paper presents an efficient methodology to characterize electromagnetic disturbances radiated fr...
Based on measurements from a near-field scanner and far-field measurements obtained in a semi-anecho...
© 2019 IEEE. In this study, we perform measurements of electromagnetic emanations from a printed cir...
The paper presents a measurement system for the evaluation of the electromagnetic emissions radiated...
© 2017 IEEE. in this paper we propose a technique for estimating the electromagnetic radiation from ...
The radiated electromagnetic (EM) field emissions from a printed circuit board (PCB) are here dealt ...
International audienceIn this article, we present a study on the measurement of the electromagnetic ...
International audienceThis paper aims at studying the near field measurement method in immunity to i...
Abstract—With the increases of the module integration density and complexity in electrical and power...
Near-field scanning has often been used to measure and characterize magnetic fields surrounding indi...
International audienceThe work presented in this two-part paper focuses on a prediction method of th...
Near-field scan on a Huygens\u27 box can be used in order to predict the maximal radiated emission f...
Abstract- I-Characterization of electromagnetic emissions from printed circuit boards (PCBs) is an i...
International audienceNear-Field Scan Immunity is a powerful technique to identify the root-cause of...
Characterization of electromagnetic emissions from printed circuit boards (PCBs) is an important iss...
The paper presents an efficient methodology to characterize electromagnetic disturbances radiated fr...
Based on measurements from a near-field scanner and far-field measurements obtained in a semi-anecho...