Add to ORKGSlope measuring deflectometry allows the non contact measurement of curved surfaces such as ultra precise elliptical cylindrical mirrors used for the focusing of synchrotron light. This paper will report on the measurement of synchrotron mirrors designed to guide and focus synchrotron light in the variable polarization beamline P04 at the PETRA III synchrotron at DESY Hamburg . These mirrors were optimized by deterministic finishing technology based on topography data provided by slope measuring deflectometry. We will show the results of the mirror inspection and discuss the expected beamline performance by ray tracing result
Nano-focusing and brightness preservation for ever brighter synchrotron radiation and free electron ...
The layout of the Variable Polarization XUV Beamline P04 at PETRA III is described with emphasis on ...
The development of third generation light sources like the Advanced Light Source (ALS) or BESSY II ...
Slope measuring deflectometry allows the non contact measurement of curved surfaces such as ultra pr...
Slope-measuring deflectometry allows the non-contact measurement of curved surfaces such as ultra-pr...
Slope measuring deflectometry allows the non-contact measuring of curves surfaces like ultra-precise...
Slope measuring deflectometry has become a standard technique for inspection of ultra precise refle...
Abstract. A plane mirror and two strongly curved plane elliptical mirrors comprising the refocusing ...
To fully exploit the ultimate source properties of the next generation light sources, such as free ...
The layout of the Variable Polarization XUV Beamline P04 at PETRAIII is described with emphasison s...
To fully exploit the ultimate source properties of the next-generation lightsources, such as free-el...
To fully exploit the ultimate source properties of the next-generation light sources, such as free-e...
The appearance of very low emittance, high-power synchrotron sources has resulted in ever longer bea...
Ultra precise reflective and diffractive optical elements like blazed diffraction gratings or ultra ...
We present recent results on the inspection of a first diffractionlimited hard X ray Kirkpatrick Bae...
Nano-focusing and brightness preservation for ever brighter synchrotron radiation and free electron ...
The layout of the Variable Polarization XUV Beamline P04 at PETRA III is described with emphasis on ...
The development of third generation light sources like the Advanced Light Source (ALS) or BESSY II ...
Slope measuring deflectometry allows the non contact measurement of curved surfaces such as ultra pr...
Slope-measuring deflectometry allows the non-contact measurement of curved surfaces such as ultra-pr...
Slope measuring deflectometry allows the non-contact measuring of curves surfaces like ultra-precise...
Slope measuring deflectometry has become a standard technique for inspection of ultra precise refle...
Abstract. A plane mirror and two strongly curved plane elliptical mirrors comprising the refocusing ...
To fully exploit the ultimate source properties of the next generation light sources, such as free ...
The layout of the Variable Polarization XUV Beamline P04 at PETRAIII is described with emphasison s...
To fully exploit the ultimate source properties of the next-generation lightsources, such as free-el...
To fully exploit the ultimate source properties of the next-generation light sources, such as free-e...
The appearance of very low emittance, high-power synchrotron sources has resulted in ever longer bea...
Ultra precise reflective and diffractive optical elements like blazed diffraction gratings or ultra ...
We present recent results on the inspection of a first diffractionlimited hard X ray Kirkpatrick Bae...
Nano-focusing and brightness preservation for ever brighter synchrotron radiation and free electron ...
The layout of the Variable Polarization XUV Beamline P04 at PETRA III is described with emphasis on ...
The development of third generation light sources like the Advanced Light Source (ALS) or BESSY II ...