This paper presents a 12-electrode piezoelectric tube scanner for fast atomic force microscopy (AFM). The scanner is used simultaneously as a sensor and an actuator. The built-in sensing mechanism of the scanner allows for displacement measurement and the unique arrangement of the electrodes allows the tube to be driven in an anti-symmetrical manner, resulting in a collocated system suitable for positive-position feedback (PPF). A PPF controller is designed to damp the scanner's resonance. The device is installed into an AFM to obtain open- and closed-loop images of a grating at 10Hz, 15.6Hz and 31Hz scan rates. The closed-loop images are noticeably superior to the open-loop images, showcasing the effectiveness of the proposed scanner
This paper considers a high-speed spiral scanning method using an atomic force microscope (AFM). In ...
Abstract — Piezoelectric tubes with quartered external elec-trodes have been widely used as scanners...
Atomic force microscopy (AFM) is a widely used tool in nano measurement and manipulation techniques....
This paper presents a 12-electrode piezoelectric tube scanner for fast atomic force microscopy (AFM)...
This paper presents a 12-electrode piezoelectric tube scanner for fast atomic force microscopy (AFM)...
This paper presents a piezoelectric tube scanner with a novel electrode pattern and describes how it...
This paper presents a piezoelectric tube scanner with a novel electrode pattern and describes how it...
This paper presents a piezoelectric tube scanner with a novel electrode pattern and describes how it...
Research Doctorate - Doctor of Philosophy (PhD)The performance of piezoelectric tube scanner in Atom...
This paper presents experimental implementation of a positive position feedback (PPF) control scheme...
This paper presents experimental implementation of a positive position feedback (PPF) control scheme...
A piezoelectric tube scanner (PTS) is made of a piezoelectric material (PZM) is used in an atomic fo...
In most nanotechnology applications, speed and precision are important requirements for obtaining go...
Most commercially available Atomic Force Microscopes (AFMs) use piezoelectric tube nano-positioners ...
A major challenge in high-speed Atomic Force Microscopy is the low vertical bandwidth of the Z-scann...
This paper considers a high-speed spiral scanning method using an atomic force microscope (AFM). In ...
Abstract — Piezoelectric tubes with quartered external elec-trodes have been widely used as scanners...
Atomic force microscopy (AFM) is a widely used tool in nano measurement and manipulation techniques....
This paper presents a 12-electrode piezoelectric tube scanner for fast atomic force microscopy (AFM)...
This paper presents a 12-electrode piezoelectric tube scanner for fast atomic force microscopy (AFM)...
This paper presents a piezoelectric tube scanner with a novel electrode pattern and describes how it...
This paper presents a piezoelectric tube scanner with a novel electrode pattern and describes how it...
This paper presents a piezoelectric tube scanner with a novel electrode pattern and describes how it...
Research Doctorate - Doctor of Philosophy (PhD)The performance of piezoelectric tube scanner in Atom...
This paper presents experimental implementation of a positive position feedback (PPF) control scheme...
This paper presents experimental implementation of a positive position feedback (PPF) control scheme...
A piezoelectric tube scanner (PTS) is made of a piezoelectric material (PZM) is used in an atomic fo...
In most nanotechnology applications, speed and precision are important requirements for obtaining go...
Most commercially available Atomic Force Microscopes (AFMs) use piezoelectric tube nano-positioners ...
A major challenge in high-speed Atomic Force Microscopy is the low vertical bandwidth of the Z-scann...
This paper considers a high-speed spiral scanning method using an atomic force microscope (AFM). In ...
Abstract — Piezoelectric tubes with quartered external elec-trodes have been widely used as scanners...
Atomic force microscopy (AFM) is a widely used tool in nano measurement and manipulation techniques....