Add to ORKGIn this study, we investigate artifacts arising from electric charges present in magnetic force microscopy images. Therefore, we use two austenitic steel samples with different microstructural conditions. Furthermore, we examine the influence of the surface preparation, like etching, in magnetic force images. Using Kelvin probe force microscopy we can quantify the charges present on the surface. Our results show that electrical charges give rise to a signature in the magnetic force microscopy, which is indistinguishable from a magnetic signal. Our results on two differently aged steel samples demonstrate that the magnetic force microscopy images need to be interpreted with care and must be corrected due to the influence of electrical charge...
Electrostatic tip-sample interactions currently represent the main limitation to accurate quantitati...
Atomic force microscopy (AFM) is a nanoscale scanning probe microscopy (SPM) characterization techni...
T h e applicability of magnetic-force microscopy (MFM) to determine micromagnetic structures is cons...
peer reviewedIn this study, we investigate artifacts arising from electric charges present in magnet...
For the past decades, Kelvin probe force microscopy (KPFM) developed from a sidebranch of atomic for...
Fast and efficient software tools previously developed in image processing were adapted to the analy...
The most outstanding feature of scanning force microscopy (SFM) is its capability to detect various ...
The study of a surface’s electrical properties at very small scales with scanning probe microscopy i...
In recent years, magnetic nonmaterial’s have been utilized in the different fields due to their uniq...
Nanotriboelectrification is studied by a Kelvin probe force microscopy (KFM)-based method. The elect...
A magnetically coated tip is a fundamental part of the MFM instrument. These tips’ are bought commer...
Long range electrostatic forces govern the imaging mechanism in electrostatic force microscopy as w...
Charge gradient microscopy (CGM) is a scanning probe imaging mode, particularly well-suited for the ...
Resumen del trabajo presentado en la 11th International Conference on Nanomaterials: Applications an...
Kelvin probe force microscopy (KPFM), a characterization method that could image surface potentials ...
Electrostatic tip-sample interactions currently represent the main limitation to accurate quantitati...
Atomic force microscopy (AFM) is a nanoscale scanning probe microscopy (SPM) characterization techni...
T h e applicability of magnetic-force microscopy (MFM) to determine micromagnetic structures is cons...
peer reviewedIn this study, we investigate artifacts arising from electric charges present in magnet...
For the past decades, Kelvin probe force microscopy (KPFM) developed from a sidebranch of atomic for...
Fast and efficient software tools previously developed in image processing were adapted to the analy...
The most outstanding feature of scanning force microscopy (SFM) is its capability to detect various ...
The study of a surface’s electrical properties at very small scales with scanning probe microscopy i...
In recent years, magnetic nonmaterial’s have been utilized in the different fields due to their uniq...
Nanotriboelectrification is studied by a Kelvin probe force microscopy (KFM)-based method. The elect...
A magnetically coated tip is a fundamental part of the MFM instrument. These tips’ are bought commer...
Long range electrostatic forces govern the imaging mechanism in electrostatic force microscopy as w...
Charge gradient microscopy (CGM) is a scanning probe imaging mode, particularly well-suited for the ...
Resumen del trabajo presentado en la 11th International Conference on Nanomaterials: Applications an...
Kelvin probe force microscopy (KPFM), a characterization method that could image surface potentials ...
Electrostatic tip-sample interactions currently represent the main limitation to accurate quantitati...
Atomic force microscopy (AFM) is a nanoscale scanning probe microscopy (SPM) characterization techni...
T h e applicability of magnetic-force microscopy (MFM) to determine micromagnetic structures is cons...