Characterization of Hardening by Design Techniques on Commercial, Small Feature Sized Field-Programmable Gate Arrays

In this thesis, a methodology is developed to experimentally test and evaluate a programmable logic device unde r gamma irradiation. The purpose of which is to determine the radiation effects and characterize the improvements of various hardening by design techniques. The techniques analyzed in this thesis include Error Correction Coding (ECC) and Triple Modular Redundancy (TMR). The TMR circuit includes three different functional implementations of adders compared to TMR voted circuits of those same adders. The TMR is implemented with the same functional adders and as a Functional TMR (FTMR) with three different function adders that are voted on. The three functional adders are: a behavioral adder that allows the FPGA synthesis software to create the implementation, a ripple carry adder that consists of multiple single bit full adders linked together, and a carry look ahead adder that operates the fastest by using an algorithm that creates generate and propagate signals. These adders are connected to single voter TMR and FTMR circuits to evaluate the improvements that could be obtained. The ECC circuit includes Block RAM (BRAM) and Distributed RAM memory elements that are loaded both with ECC and non-error corrected data. The circuit is designed to check for errors in memory data, stuck bit values in the memory, and the performance improvements that ECC provides the system