Journal ArticleNoise and radiation-induced soft errors (transient faults) in computer systems have increased significantly over the last few years and are expected to increase even more as we move toward smaller transistor sizes and lower supply voltages. Fault detection and recovery can be achieved through redundancy. The emergence of chip multiprocessors (CMPs) makes it possible to execute redundant threads on a chip and provide relatively low-cost reliability. State-of-the-art implementations execute two copies of the same program as two threads (redundant multithreading), either on the same or on separate processor cores in a CMP, and periodically check results. Although this solution has favorable performance and reliability properti...
This paper describes the design of a power efficient microarchitecture for transient fault detection...
Relentless CMOS scaling coupled with lower design tolerances is making ICs increasingly susceptible ...
Exponential growth in. the number of on-chip transistors, coupled with reductions in voltage levels,...
Continued CMOS scaling is expected to make future micro-processors susceptible to transient faults, ...
Relentless CMOS scaling coupled with lower design tolerances is making ICs increasingly susceptible ...
Journal ArticleRedundant multi-threading (RMT) has been proposed as an architectural approach that ...
Continued CMOS scaling is expected to make future micro-processors susceptible to transient faults, ...
Journal ArticleDue to shrinking transistor sizes and lower supply voltages, transient faults (soft e...
Smaller transistor sizes and reduction in voltage levels in modern microprocessors induce higher sof...
abstract: Reducing device dimensions, increasing transistor densities, and smaller timing windows, e...
Abstract—Reducing device dimensions, increasing transistor densities, and smaller timing windows, ex...
To protect processor logic from soft errors, multicore redundant architectures execute two copies of...
Relentless CMOS scaling coupled with lower design tolerances is making ICs increasingly susceptible ...
Relentless CMOS scaling coupled with lower design tolerances is making ICs increasingly susceptible ...
This paper describes the design of a power efficient microarchitecture for transient fault detection...
This paper describes the design of a power efficient microarchitecture for transient fault detection...
Relentless CMOS scaling coupled with lower design tolerances is making ICs increasingly susceptible ...
Exponential growth in. the number of on-chip transistors, coupled with reductions in voltage levels,...
Continued CMOS scaling is expected to make future micro-processors susceptible to transient faults, ...
Relentless CMOS scaling coupled with lower design tolerances is making ICs increasingly susceptible ...
Journal ArticleRedundant multi-threading (RMT) has been proposed as an architectural approach that ...
Continued CMOS scaling is expected to make future micro-processors susceptible to transient faults, ...
Journal ArticleDue to shrinking transistor sizes and lower supply voltages, transient faults (soft e...
Smaller transistor sizes and reduction in voltage levels in modern microprocessors induce higher sof...
abstract: Reducing device dimensions, increasing transistor densities, and smaller timing windows, e...
Abstract—Reducing device dimensions, increasing transistor densities, and smaller timing windows, ex...
To protect processor logic from soft errors, multicore redundant architectures execute two copies of...
Relentless CMOS scaling coupled with lower design tolerances is making ICs increasingly susceptible ...
Relentless CMOS scaling coupled with lower design tolerances is making ICs increasingly susceptible ...
This paper describes the design of a power efficient microarchitecture for transient fault detection...
This paper describes the design of a power efficient microarchitecture for transient fault detection...
Relentless CMOS scaling coupled with lower design tolerances is making ICs increasingly susceptible ...
Exponential growth in. the number of on-chip transistors, coupled with reductions in voltage levels,...