Among the black-box approaches to digital circuit testing, Random testing is popular due to its simplicity and cost effectiveness. Unfortunately, available evidences suggest that Random testing is equipped with a number of redundant patterns that increase test length without signi cantly raising the fault coverage. An extension to Random testing is Antirandom that removes redundancy by introducing a divergent pattern with every subsequent test pattern selection. A divergent pattern is induced by maximizing the Hamming distance and Cartesian distance of every subsequent test pattern from the set of previously applied test patterns. However, an enumeration of input combinations is required for the selection of a divergent pattern. Therefore, ...
A new testing paradigm called Built-In Self-Test (BIST) has been gaining increasing acceptance over ...
During pseudorandom testing, a significant amount of energy and test application time is wasted for ...
Controlled random tests, methods of their generation, main criteria used for their synthesis, such a...
Among the black-box approaches to digital circuit testing, Random testing is popular due to its simp...
Testing and verification of digital circuits is of vital importance in electronics industry. Moreove...
Determination of the most appropriate test set is critical for high fault coverage in testing of dig...
Random testing is a well known concept that requires that each test is selected randomly regardless ...
Pseudorandom testing is incapable of utilizing the success rate of preceding test patterns while gen...
An efficient method has been presented to compute multiple distributions for random patterns, which ...
Random pattern testing methods are known to result in poor fault coverage for most sequential circui...
Experience has shown that an excessive time penalty can be incurred when testing large scan circuits...
Two novel methods to reduce the number of random test patterns required to fully test a circuit are ...
Adaptive Random Testing is a Black Box testing method based on the intuition that Random Testing fai...
Adaptive random testing (ART) has been proposed as an enhancement to random testing for situations w...
Previous title: « RSIC Generation: A Solution for Logic BIST »International audienceHigh defect cove...
A new testing paradigm called Built-In Self-Test (BIST) has been gaining increasing acceptance over ...
During pseudorandom testing, a significant amount of energy and test application time is wasted for ...
Controlled random tests, methods of their generation, main criteria used for their synthesis, such a...
Among the black-box approaches to digital circuit testing, Random testing is popular due to its simp...
Testing and verification of digital circuits is of vital importance in electronics industry. Moreove...
Determination of the most appropriate test set is critical for high fault coverage in testing of dig...
Random testing is a well known concept that requires that each test is selected randomly regardless ...
Pseudorandom testing is incapable of utilizing the success rate of preceding test patterns while gen...
An efficient method has been presented to compute multiple distributions for random patterns, which ...
Random pattern testing methods are known to result in poor fault coverage for most sequential circui...
Experience has shown that an excessive time penalty can be incurred when testing large scan circuits...
Two novel methods to reduce the number of random test patterns required to fully test a circuit are ...
Adaptive Random Testing is a Black Box testing method based on the intuition that Random Testing fai...
Adaptive random testing (ART) has been proposed as an enhancement to random testing for situations w...
Previous title: « RSIC Generation: A Solution for Logic BIST »International audienceHigh defect cove...
A new testing paradigm called Built-In Self-Test (BIST) has been gaining increasing acceptance over ...
During pseudorandom testing, a significant amount of energy and test application time is wasted for ...
Controlled random tests, methods of their generation, main criteria used for their synthesis, such a...