Add to ORKGThe development of empirical expressions for the spectral dependence of the real and imaginary components of the dielectric function have proven useful over the years. These expressions can be applied in the analysis of optical data, including the interpretation of transmittance, reflectance, and ellipsometric spectra obtained from thin film semiconductors. Also, they can be used in performance simulations of optoelectronic devices, such as solar cells. In this thesis, a critical comparison of a number of empirical models for the real and imaginary components of the dielectric function is performed. A number of crystalline and disordered semiconductors of interest are considered in this analysis. Also, a new means of numerically evaluating ...
The research efforts of physical scientists over twenty years have helped to secure a promising comm...
The research efforts of physical scientists over twenty years have helped to secure a promising comm...
Using Adachi’s expression [S. Adachi, Phys. Rev. B 43, 12 316 (1991)] for the complex dielectric fun...
Models for the spectral dependence of the real and imaginary components of the dielectric function, ...
The Tauc–Lorentz–Urbach (TLU) dispersion model allows us to build a dielectric function from only a ...
Defects play an important role in shaping the optical response of a semiconductor material. In this ...
Defects play an important role in shaping the optical response of a semiconductor material. In this ...
Through the use of a general empirical model for the density of states functions, one that considers...
We have developed a Kramers-Kronig consistent analytical expression to fit the dielectric functions ...
Optical methods like spectroscopic ellipsometry are sensitive to structural properties of semicondu...
We have developed a Kramers-Kronig consistent analytical expression to fit the measured optical func...
This contribution addresses the relevant question of retrieving, from transmittance data, the optica...
International audienceWe have developed a Kramers-Kronig consistent analytical expression to fit the...
The research efforts of physical scientists over twenty years have helped to secure a promising comm...
ellipsometry (SE) is a non-invasive optical diagnostic that measures the change in polarization of l...
The research efforts of physical scientists over twenty years have helped to secure a promising comm...
The research efforts of physical scientists over twenty years have helped to secure a promising comm...
Using Adachi’s expression [S. Adachi, Phys. Rev. B 43, 12 316 (1991)] for the complex dielectric fun...
Models for the spectral dependence of the real and imaginary components of the dielectric function, ...
The Tauc–Lorentz–Urbach (TLU) dispersion model allows us to build a dielectric function from only a ...
Defects play an important role in shaping the optical response of a semiconductor material. In this ...
Defects play an important role in shaping the optical response of a semiconductor material. In this ...
Through the use of a general empirical model for the density of states functions, one that considers...
We have developed a Kramers-Kronig consistent analytical expression to fit the dielectric functions ...
Optical methods like spectroscopic ellipsometry are sensitive to structural properties of semicondu...
We have developed a Kramers-Kronig consistent analytical expression to fit the measured optical func...
This contribution addresses the relevant question of retrieving, from transmittance data, the optica...
International audienceWe have developed a Kramers-Kronig consistent analytical expression to fit the...
The research efforts of physical scientists over twenty years have helped to secure a promising comm...
ellipsometry (SE) is a non-invasive optical diagnostic that measures the change in polarization of l...
The research efforts of physical scientists over twenty years have helped to secure a promising comm...
The research efforts of physical scientists over twenty years have helped to secure a promising comm...
Using Adachi’s expression [S. Adachi, Phys. Rev. B 43, 12 316 (1991)] for the complex dielectric fun...