Electrokinetic development length of electroviscous flow through a contraction

This study presents an analysis of the electrokinetic development length of electroviscous flow through a slit-like contraction. The effect of contraction ratio, electric double-layer thickness and wall surface charge on the electrokinetic development length of electroviscous flow is quantified. An order of magnitude expression for the electrokinetic development length is derived. References C. J. C. Biscombe, M. R. Davidson, and D. J. E. Harvie. Microfluidic circuit analysis {II}: Implications of ion conservation in series circuits. Journal of Colloid and Interface Science, 2011. doi:10.1016/j.jcis.2011.07.078. M. Davidson and D. Harvie. {Electroviscous effects in low Reynolds number liquid flow through a slit-like microfluidic contraction}. Chemical Engineering Science, 62\penalty 0 (16):\penalty 0 4229--4240, August 2007. doi:10.1016/j.ces.2007.05.006 F. Durst, S. Ray, B. Unsal, and O. A. Bayoumi. {The development lengths of laminar pipe and channel flows}. Journal of Fluids Engineering, 127\penalty 0 (6):\penalty 0 1154, 2005. doi:10.1115/1.2063088 D. J. E. Harvie, C. J. C. Biscombe, and M. R. Davidson. Microfluidic circuit analysis {I}: Ion current relationships for thin slits and pipes. Journal of Colloid and Interface Science, 2011. doi:10.1016/j.jcis.2011.07.076. J. H. Masliyah and S. Bhattacharjee. {Electrokinetic and Colloid Transport Phenomena}. Wiley-Interscience, Hoboken, New Jersey, 2006. H.A. Stone, A.D. Stroock, and A. Ajdari. {Engineering Flows in Small Devices}. Annual Review of Fluid Mechanics, 36\penalty 0 (1):\penalty 0 381--411, January 2004. doi:10.1146/annurev.fluid.36.050802.122124 R.-J. Yang, L.-M. Fu, and C.-C. Hwang. Electroosmotic entry flow in a microchannel. Journal of Colloid and Interface Science, 244:\penalty 0 173--179, 2001. doi:10.1006/jcis.2001.7847 R.-J. Yang, T.-I. Tseng, and C.-C Chang. End effects on electro-osmotic flows in micro-channels. Journal of Micromechanics and Microengineering, 15:\penalty 0 254--262, 2005. doi:10.1088/0960-1317/15/2/00