International audienceBallistic electron-emission microscopy (BEEM) is an experimental technique measuring the electron current which, injected from the tip of a scanning tunneling microscope (STM) into a thin metallic overlayer, travels through an underlying metal-semiconductor (MS) interface and is finally collected in the semiconductor substrate. Since its discovery, the main applications of BEEM were focused on the study of Schottky-barrier heights and of electron transport across MS interfaces, with a nanometer lateral resolution. Given the current trend in the development of electronic devices at the nanometer scale, these properties make the BEEM technique a powerful tool for the characterization and the control of MS heterostructure...
The purpose of this work was to develop a ballistic electron emission microscopy (BEEM) set-up that ...
Abstract. The objective of the contract was the investigation of hot electron transport on a microsc...
In 1988, Kaiser and Bell first demonstrated the unique capability of Ballistic Electron Emission Mic...
International audienceBallistic electron-emission microscopy (BEEM) is an experimental technique mea...
Ballistic electron emission microscopy (BEEM) is a powerful new low energy electron microscopy in ma...
Ballistic Electron Emission Microscopy (BEEM) has been shown to be a powerful tool for nanometer-sca...
Ce travail de thèse s est développé autour de la microscopie à émission d électrons balistiques (BEE...
BEEM is a powerful, new low energy electron microscopy for imaging and spectroscopy of buried quantu...
The measurement of heterojunction band parameters and their spatial variation is of fundamental impo...
Ballistic electron emission microscopy (BEEM) was employed to study metal/dielectric/semiconductor d...
BEEM is a powerful, new low energy electron microscopy for imaging and spectroscopy of buried quantu...
Monte Carlo simulations of the transport of electrons injected into the Γ valley of GaAs are perform...
Through the results obtained on Au-Si(100) junctions, we show the main aspects of Ballistic Electron...
PACS. 61.16Ch { Scanning probe microscopy: scanning tunneling, atomic force, scanning opti-cal, magn...
Due to the character of the original source materials and the nature of batch digitization, quality ...
The purpose of this work was to develop a ballistic electron emission microscopy (BEEM) set-up that ...
Abstract. The objective of the contract was the investigation of hot electron transport on a microsc...
In 1988, Kaiser and Bell first demonstrated the unique capability of Ballistic Electron Emission Mic...
International audienceBallistic electron-emission microscopy (BEEM) is an experimental technique mea...
Ballistic electron emission microscopy (BEEM) is a powerful new low energy electron microscopy in ma...
Ballistic Electron Emission Microscopy (BEEM) has been shown to be a powerful tool for nanometer-sca...
Ce travail de thèse s est développé autour de la microscopie à émission d électrons balistiques (BEE...
BEEM is a powerful, new low energy electron microscopy for imaging and spectroscopy of buried quantu...
The measurement of heterojunction band parameters and their spatial variation is of fundamental impo...
Ballistic electron emission microscopy (BEEM) was employed to study metal/dielectric/semiconductor d...
BEEM is a powerful, new low energy electron microscopy for imaging and spectroscopy of buried quantu...
Monte Carlo simulations of the transport of electrons injected into the Γ valley of GaAs are perform...
Through the results obtained on Au-Si(100) junctions, we show the main aspects of Ballistic Electron...
PACS. 61.16Ch { Scanning probe microscopy: scanning tunneling, atomic force, scanning opti-cal, magn...
Due to the character of the original source materials and the nature of batch digitization, quality ...
The purpose of this work was to develop a ballistic electron emission microscopy (BEEM) set-up that ...
Abstract. The objective of the contract was the investigation of hot electron transport on a microsc...
In 1988, Kaiser and Bell first demonstrated the unique capability of Ballistic Electron Emission Mic...