Add to ORKGA method of applying spectroscopic ellipsometry to arrive at accurate values of optical and physical properties for thin films on samples having rough or textured surfaces
A method is presented whereby the thickness and complex refractive index of a very think, partially ...
Surface roughness is studied experimentally by making use of the statistical properties of dichromat...
Surface roughness is studied experimentally by making use of the statistical properties of dichromat...
A method of applying spectroscopic ellipsometry to arrive at accurate values of optical and physical...
An optical surface roughness model is presented, which allows a reliable determination of the dielec...
Thin films with high surface roughness: thickness and dielectric function analysis using spectroscop...
The manufacture of optical coatings, computer disks, as well as advanced electronic multilayered dev...
An optical surface roughness model is presented, which allows a reliable determination of the dielec...
The accuracy of measurement of the thickness of uniform thin films on solid substrates by null ellip...
Surface topography and light scattering were measured on 15 samples ranging from those having smooth...
This paper describes the use of ellipsometry as a precise and accurate technique for characterizing ...
Spectroscopic ellipsometry (SE) is an effective method to measure the optical constants of thin film...
R6sum6.- Une classification des surfaces rugueuses a kt6 effectuke. Trois mod61es d'un systkme ...
A method is presented whereby the thickness and complex refractive index of a very think, partially ...
A dual rotating-compensator Mueller matrix ellipsometer has been designed and constructed to carry o...
A method is presented whereby the thickness and complex refractive index of a very think, partially ...
Surface roughness is studied experimentally by making use of the statistical properties of dichromat...
Surface roughness is studied experimentally by making use of the statistical properties of dichromat...
A method of applying spectroscopic ellipsometry to arrive at accurate values of optical and physical...
An optical surface roughness model is presented, which allows a reliable determination of the dielec...
Thin films with high surface roughness: thickness and dielectric function analysis using spectroscop...
The manufacture of optical coatings, computer disks, as well as advanced electronic multilayered dev...
An optical surface roughness model is presented, which allows a reliable determination of the dielec...
The accuracy of measurement of the thickness of uniform thin films on solid substrates by null ellip...
Surface topography and light scattering were measured on 15 samples ranging from those having smooth...
This paper describes the use of ellipsometry as a precise and accurate technique for characterizing ...
Spectroscopic ellipsometry (SE) is an effective method to measure the optical constants of thin film...
R6sum6.- Une classification des surfaces rugueuses a kt6 effectuke. Trois mod61es d'un systkme ...
A method is presented whereby the thickness and complex refractive index of a very think, partially ...
A dual rotating-compensator Mueller matrix ellipsometer has been designed and constructed to carry o...
A method is presented whereby the thickness and complex refractive index of a very think, partially ...
Surface roughness is studied experimentally by making use of the statistical properties of dichromat...
Surface roughness is studied experimentally by making use of the statistical properties of dichromat...