TERAHERTZ-INFRARED ELLIPSOMETER SYSTEM, AND METHOD OF USE

The present invention relates to ellipsometer and polarimeter systems, and more particularly is an ellipsometer or polarimeter or the like system which operates in a frequency range between 300 GHz or lower and extending to higher than at least 1 Tera-hertz (THz), and preferably through the Infra-red (IR) range up Sh and his th. 100 THz, including: a Source Such as a backward wave oscillator, a Smith-Purcell cell; a free electron laser, or an FTIR source and a solid state device; and a detector Such as a Golay cell; abolometer or a solid state detector: and preferably including a polarization state generator comprising: an odd bounce image rotating system and a polarizer, or two polarizers; and optionally including least one compensator and/or modulator, in addition to an analyzer