Over three decades of continuous scaling in CMOS technology has led to tremendous improvements in processor performance. At the same time, the scaling has led to an increase in the frequency of hardware errors due to high process variations, extreme operating conditions and manufacturing defects. Recent studies have found that 40% of the processor failures in real-world machines are due to intermittent hardware errors. Intermittent hardware errors are non-deterministic bursts of errors that occur in the same physical location. Intermittent errors have characteristics that are different from transient and permanent errors, which makes it challenging to devise efficient fault tolerance techniques for them. In this dissertation, we characteriz...
With continued CMOS scaling, future shipped hardware will be increasingly vulnerable to in-the-field...
© 2016 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for a...
Technology and voltage scaling is making integrated circuits increasingly susceptible to failures ca...
Intermittent hardware faults are hard to diagnose as they occur non-deterministically. Hardware-only...
Abstract—The frequency of hardware errors is increasing due to shrinking feature sizes, higher level...
Abstract—Intermittent hardware faults are bursts of errors that last from a few CPU cycles to a few ...
Abstract—Intermittent hardware faults are hard to diagnose as they occur non-deterministically at th...
As CMOS technology scales to the nanometer range, designers have to deal with a growing number and v...
Technology scaling of integrated circuits is making transistors increasingly sensitive to process va...
Abstract—As CMOS technology scales into the nanometer era, future shipped microprocessors will be in...
Hardware errors are projected to increase in modern computer systems due to shrinking feature sizes ...
© 2014 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for a...
The evolution of high-performance and low-cost microprocessors has led to their almost pervasive usa...
Thesis (Ph. D.)--University of Rochester. Dept. of Electrical and Computer Engineering, 2012In moder...
This thesis addresses the problem of measuring hardware error sensitivity of computer systems. Hardw...
With continued CMOS scaling, future shipped hardware will be increasingly vulnerable to in-the-field...
© 2016 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for a...
Technology and voltage scaling is making integrated circuits increasingly susceptible to failures ca...
Intermittent hardware faults are hard to diagnose as they occur non-deterministically. Hardware-only...
Abstract—The frequency of hardware errors is increasing due to shrinking feature sizes, higher level...
Abstract—Intermittent hardware faults are bursts of errors that last from a few CPU cycles to a few ...
Abstract—Intermittent hardware faults are hard to diagnose as they occur non-deterministically at th...
As CMOS technology scales to the nanometer range, designers have to deal with a growing number and v...
Technology scaling of integrated circuits is making transistors increasingly sensitive to process va...
Abstract—As CMOS technology scales into the nanometer era, future shipped microprocessors will be in...
Hardware errors are projected to increase in modern computer systems due to shrinking feature sizes ...
© 2014 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for a...
The evolution of high-performance and low-cost microprocessors has led to their almost pervasive usa...
Thesis (Ph. D.)--University of Rochester. Dept. of Electrical and Computer Engineering, 2012In moder...
This thesis addresses the problem of measuring hardware error sensitivity of computer systems. Hardw...
With continued CMOS scaling, future shipped hardware will be increasingly vulnerable to in-the-field...
© 2016 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for a...
Technology and voltage scaling is making integrated circuits increasingly susceptible to failures ca...