Sequential circuit test generation using deterministic, fault-oriented algorithms is highly complex and time consuming. New approaches are needed to enhance the existing techniques, both the reduce execution time and improve fault coverage. Evolutionary algorithms have been effective in solving many search and optimization problems. A common search operation in sequential ATPG is to justify a desired state assignment on the sequential elements. State justification using deterministic algorithms is a difficult problem and is prone to many backtracks, which can lead to high execution times. In this work, we propose a hybrid approach which uses a combination of evolutionary and deterministic algorithms for state justification. A new method bas...
107 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2002.Finally, a GA-based diagnosti...
This paper discusses a Genetic Algorithm-based method of generating test vectors for detecting fault...
This paper discusses a Genetic Algorithm-based method of generating test vectors for detecting fault...
Sequential circuit test generation using deterministic, fault-oriented algorithms is highly complex ...
Sequential circuit test generation using deterministic, fault-oriented algorithms is highly complex ...
Sequential circuit test generation using deterministic, fault-oriented algorithms is highly complex ...
State justifcation is one of the most time-consuming tasks in sequential Automatic Test Pattern Gene...
• Motivation • Test Pattern Generation for Sequential Circuits • Genetic Algorithms (GA) • Problem D...
Abstract|Test generation using deterministic faultoriented algorithms is highly complex and time-con...
Coordinated Science Laboratory was formerly known as Control Systems LaboratoryARPA / DABT63-95-C-00...
The paper describes the application of a Parallel Genetic Algorithm to Automatic Test Pattern Genera...
Genetic Algorithms have been recently investigated as an efficient approach to test generation for s...
The paper deals with the problem of Automatic Generation of Test Sequences for digital circuits. Gen...
Fault simulators are used extensively in the design of electronic circuits for both testing and faul...
The problem of test generation belongs to the class of NP-complete problems and it is becoming more ...
107 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2002.Finally, a GA-based diagnosti...
This paper discusses a Genetic Algorithm-based method of generating test vectors for detecting fault...
This paper discusses a Genetic Algorithm-based method of generating test vectors for detecting fault...
Sequential circuit test generation using deterministic, fault-oriented algorithms is highly complex ...
Sequential circuit test generation using deterministic, fault-oriented algorithms is highly complex ...
Sequential circuit test generation using deterministic, fault-oriented algorithms is highly complex ...
State justifcation is one of the most time-consuming tasks in sequential Automatic Test Pattern Gene...
• Motivation • Test Pattern Generation for Sequential Circuits • Genetic Algorithms (GA) • Problem D...
Abstract|Test generation using deterministic faultoriented algorithms is highly complex and time-con...
Coordinated Science Laboratory was formerly known as Control Systems LaboratoryARPA / DABT63-95-C-00...
The paper describes the application of a Parallel Genetic Algorithm to Automatic Test Pattern Genera...
Genetic Algorithms have been recently investigated as an efficient approach to test generation for s...
The paper deals with the problem of Automatic Generation of Test Sequences for digital circuits. Gen...
Fault simulators are used extensively in the design of electronic circuits for both testing and faul...
The problem of test generation belongs to the class of NP-complete problems and it is becoming more ...
107 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2002.Finally, a GA-based diagnosti...
This paper discusses a Genetic Algorithm-based method of generating test vectors for detecting fault...
This paper discusses a Genetic Algorithm-based method of generating test vectors for detecting fault...