During recent years, the theory of charged particle optics together with advances in fabrication tolerances and experimental techniques has lead to very significant advances in high-performance electron microscopes. Here, we will describe which theoretical tools, inventions and designs have driven this development. We cover the basic theory of higher-order electron optics and of image formation in electron microscopes. This leads to a description of different methods to correct aberrations by multipole fields and to a discussion of the most advanced design that take advantage of these techniques. The theory of electron mirrors is developed and it is shown how this can be used to correct aberrations and to design energy filters. Finally, dif...
Chapter I describes how, by the application of magnetic lenses, the size of electron diffraction pat...
The aim of this book is to outline the physics of image formation, electron specimen interactions a...
This second edition is an extended version of the first edition of Geometrical Charged-Particle Opti...
This thesis deals with topics of aberration reduction in high voltage ("" 100 k V) electron optical ...
This paper summarizes theoretical research on electron optics in the field of electron microscopy th...
The design of modern electron microscopes could not be possible without appropriate software tools. ...
Contains research objectives and summary of research.Joint Services Electronics Program (Contract DA...
We report recent progress in the construction of a new aberration-corrected photoemission electron m...
We report recent progress in the construction of a new aberration-corrected photoemission electron m...
A converging electron mirror can be used to compensate spherical and chromatic aberrations in an ele...
A converging electron mirror can be used to compensate spherical and chromatic aberrations in an ele...
A converging electron mirror can be used to compensate spherical and chromatic aberrations in an ele...
We evaluate the probe forming capability of a JEOL 2200FS transmission electron microscope equipped ...
Transmission Electron Microscopy: Physics of Image Formation presents the theory of image and contra...
The high negative bias of a sample in a scanning electron microscope constitutes the “cathode lens” ...
Chapter I describes how, by the application of magnetic lenses, the size of electron diffraction pat...
The aim of this book is to outline the physics of image formation, electron specimen interactions a...
This second edition is an extended version of the first edition of Geometrical Charged-Particle Opti...
This thesis deals with topics of aberration reduction in high voltage ("" 100 k V) electron optical ...
This paper summarizes theoretical research on electron optics in the field of electron microscopy th...
The design of modern electron microscopes could not be possible without appropriate software tools. ...
Contains research objectives and summary of research.Joint Services Electronics Program (Contract DA...
We report recent progress in the construction of a new aberration-corrected photoemission electron m...
We report recent progress in the construction of a new aberration-corrected photoemission electron m...
A converging electron mirror can be used to compensate spherical and chromatic aberrations in an ele...
A converging electron mirror can be used to compensate spherical and chromatic aberrations in an ele...
A converging electron mirror can be used to compensate spherical and chromatic aberrations in an ele...
We evaluate the probe forming capability of a JEOL 2200FS transmission electron microscope equipped ...
Transmission Electron Microscopy: Physics of Image Formation presents the theory of image and contra...
The high negative bias of a sample in a scanning electron microscope constitutes the “cathode lens” ...
Chapter I describes how, by the application of magnetic lenses, the size of electron diffraction pat...
The aim of this book is to outline the physics of image formation, electron specimen interactions a...
This second edition is an extended version of the first edition of Geometrical Charged-Particle Opti...