Noise has been measured in a number of biased solid tantalum capacitors at frequencies down to 0.01 Hz. The noise current was found to have a 1/f power spectrum, and the amplitude varied with the bias voltage with a law in the range 1st to 4th power. There was a large difference in amplitudes between different capacitors of the same type
The transport mechanism of HfO2-based metal-ferroelectric-metal (MFM) capacitors was investigated us...
The noise figure of the transistor amplifier is of special interest since the large quantity of exce...
Studies of electrical properties, including noise properties, of thick-film resistors prepared from ...
A low frequency noise and charge carriers transport mechanism analysis was performed on tantalum cap...
Low frequency current noise in unstressed/stressed thin oxide metal-oxide-semiconductor capacitor
Pronounced changes in low-frequency noise power spectra have been observed, close to the transition ...
This paper deals with the measurement of low values of electrical voltages and currents from sources...
Some experimental techniques for low-frequency resistance noise measurements are discussed. The crit...
We investigated the 1/f noise of Pt/NiO/Pt capacitors that show unipolar resistance switching. When ...
Here we investigate dc characteristics, impedance versus frequency, and low frequency noise. The eff...
Abstract-This survey deals with l/f noise in homogeneous semiconductor samples. A distinction is mad...
Equipment is described for measuring current-noise from resistors of large resistance values, with s...
An apparatus for the measurement of noise as a function of frequency is described. This apparatus ha...
A developed method and measurement setup for measurement of noise generated in a supercapacitor is p...
In modern submicrometer transistors, the influence of the internal base and emitter series resistanc...
The transport mechanism of HfO2-based metal-ferroelectric-metal (MFM) capacitors was investigated us...
The noise figure of the transistor amplifier is of special interest since the large quantity of exce...
Studies of electrical properties, including noise properties, of thick-film resistors prepared from ...
A low frequency noise and charge carriers transport mechanism analysis was performed on tantalum cap...
Low frequency current noise in unstressed/stressed thin oxide metal-oxide-semiconductor capacitor
Pronounced changes in low-frequency noise power spectra have been observed, close to the transition ...
This paper deals with the measurement of low values of electrical voltages and currents from sources...
Some experimental techniques for low-frequency resistance noise measurements are discussed. The crit...
We investigated the 1/f noise of Pt/NiO/Pt capacitors that show unipolar resistance switching. When ...
Here we investigate dc characteristics, impedance versus frequency, and low frequency noise. The eff...
Abstract-This survey deals with l/f noise in homogeneous semiconductor samples. A distinction is mad...
Equipment is described for measuring current-noise from resistors of large resistance values, with s...
An apparatus for the measurement of noise as a function of frequency is described. This apparatus ha...
A developed method and measurement setup for measurement of noise generated in a supercapacitor is p...
In modern submicrometer transistors, the influence of the internal base and emitter series resistanc...
The transport mechanism of HfO2-based metal-ferroelectric-metal (MFM) capacitors was investigated us...
The noise figure of the transistor amplifier is of special interest since the large quantity of exce...
Studies of electrical properties, including noise properties, of thick-film resistors prepared from ...
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