Embedded systems used in harsh environments are susceptible to bit-flips, which can cause data flow errors. In order to increase the reliability of embedded systems, numerous data flow error detection techniques have already been developed. It is, however, difficult to identify the best technique to apply, due to differences in the way they are evaluated in current literature. This paper presents an empirical comparative study of seven existing techniques. We measured fault coverage, execution time overhead, and code size overhead. We conclude that soft error detection using software redundancy (SEDSR) and error detection by duplicated instructions (EDDI) have a better trade-off between fault coverage and overheads than software-implemente...
Recent increase of transient fault rates has made processor reliability a major concern. Moreover pe...
International audienceThis paper presents two error models to evaluate safety of a software error de...
Hardware errors are on the rise with reducing chip sizes, and power constraints have necessitated th...
This paper presents a literature review on data flow error detection and recovery techniques in embe...
Embedded systems’ hardware can be impacted by soft errors, which can cause data flow errors in the s...
This paper presents a theoretical comparison of different existing data error detection techniques. ...
© 2018 IEEE. This paper presents a new software-implemented data error detection technique called Fu...
This paper presents a new error detection technique called software implemented error detection (SIE...
Today, embedded systems are being used in many (safety-critical) applications. However, due to their...
In this paper, we present a new software approach Instruction Level Duplication and Comparison (ILDC...
Embedded systems are increasingly deployed in harsh environments that their components were not nece...
International audienceSoft errors with multiple erroneous bits have become a significant threat in e...
In modern safety-critical embedded systems reliability and performance are two important criteria. I...
Shrinking microprocessor feature size and growing transistor density may increase the soft-error rat...
Electrostatic discharge (ESD) related embedded software error is a critical issue for electronic pro...
Recent increase of transient fault rates has made processor reliability a major concern. Moreover pe...
International audienceThis paper presents two error models to evaluate safety of a software error de...
Hardware errors are on the rise with reducing chip sizes, and power constraints have necessitated th...
This paper presents a literature review on data flow error detection and recovery techniques in embe...
Embedded systems’ hardware can be impacted by soft errors, which can cause data flow errors in the s...
This paper presents a theoretical comparison of different existing data error detection techniques. ...
© 2018 IEEE. This paper presents a new software-implemented data error detection technique called Fu...
This paper presents a new error detection technique called software implemented error detection (SIE...
Today, embedded systems are being used in many (safety-critical) applications. However, due to their...
In this paper, we present a new software approach Instruction Level Duplication and Comparison (ILDC...
Embedded systems are increasingly deployed in harsh environments that their components were not nece...
International audienceSoft errors with multiple erroneous bits have become a significant threat in e...
In modern safety-critical embedded systems reliability and performance are two important criteria. I...
Shrinking microprocessor feature size and growing transistor density may increase the soft-error rat...
Electrostatic discharge (ESD) related embedded software error is a critical issue for electronic pro...
Recent increase of transient fault rates has made processor reliability a major concern. Moreover pe...
International audienceThis paper presents two error models to evaluate safety of a software error de...
Hardware errors are on the rise with reducing chip sizes, and power constraints have necessitated th...