High-Speed and Low-Noise Readout Circuitry for CMOS Image Sensors

CMOS image sensor design challenges lie in the optimization of key parameters such as the noise, the power consumption, and the speed. Especially, in industrial, surveillance and automotive applications these three parameters strongly need to be improved. In order to improve these three key performance parameters, attention needs to be paid to both the pixels and the readout circuitry, which includes amplifiers and analog-to-digital converters. By exploring analog and mixed-signal architectures and designs for the readout interface of the CMOS image sensors, work at device level in pixels can be complemented or avoided, making the design more feasible for standard technologies and saving development time and cost. The main goals of the research are to focus on achieve simultaneously low noise and high readout speed at low power consumption by optimizing the analog and mixed-signal circuitry of CMOS image sensor interfaces.nrpages: 143status: publishe