Tip-enhanced Raman scattering microscopy: Recent advance in tip production

Tip-enhanced Raman scattering (TERS) microscopy is a technique that combines the chemical sensitivity of Raman spectroscopy with the resolving power of scanning probe microscopy. The key component of any TERS setup is a plasmonically-active noble metal tip, which serves to couple far-field incident radiation with the near-field. Thus, the design and implementation of reproducible probes are crucial for the continued development of TERS as a tool for nanoscopic analysis. Here we discuss conventional methods for the fabrication of TERS-ready tips, highlighting the problems therein, as well as detailing more recent developments to improve reducibility. In addition, the idea of remote excitation-TERS is enlightened upon, whereby TERS sensitivity is further improved by using propagating surface plasmons to separate the incident radiation from the tip apex, as well as how this can be incorporated into the fabrication process.journal_title: Japanese Journal of Applied Physics article_type: rev article_title: Tip-enhanced Raman scattering microscopy: Recent advance in tip production copyright_information: © 2016 The Japan Society of Applied Physics date_received: 2016-02-18 date_accepted: 2016-05-05 date_epub: 2016-07-11status: publishe