In vacuo measurement of the sensitivity limit of planar Bragg sensors
- Parker, R.M.
- Gates, J.C.
- Sessions, N.P.
- Kundys, D.O.
- Gawith, C.B.E.
- Grossel, M.C.
- Smith, P.G.R.
Publication date
June 2009
DOI Publisher
Institute of Electrical and Electronics Engineers (IEEE) Language
EnglishAbstract
We present the direct measurement and modeling of the sensitivity limit of an integrated refractive index sensor for the detection of molecular monolayers. Direct UV writing can be used to fabricate a wide range of integrated optical devices particularly Bragg gratings. These Bragg gratings are inherently sensitive to temperature and strain
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