International audienceUnderstanding the transient behavior of ESD protection devices is a key to optimize IC protection solutions. However, outside of the ESD world, electrical characterization of pulsed electrical signal involving both kilowatts of power and extreme frequency bandwidth (DC to several GHz) is definitely not common. Dedicated and specific measurement methodologies are thus required. In this work, we proposed a new and simple method that allows accurate triggering behavior measurements based on a standard very-fast TLP setup, which does not compromise on any performance aspects (bandwidth, maximum current, single-pulse, simplicity...) and does not require any additional or external characterization equipment
As process technologies advance into deep sub-micrometer and nanometer scale, the charged device mod...
This paper presents a new measurement method that enables investigating the degradations of protecti...
A Transient safe operating area (TSOA) definition for ESD applications is introduced. Within this co...
International audienceUnderstanding the transient behavior of ESD protection devices is a key to opt...
International audienceA comprehensive study of the limitations of vf-TLP setup for transient measure...
This paper describes a test method which allows the investigation of the transient switching behavio...
International audienceThe key parameters in the optimization of the Diode Triggered Silicon-Controll...
International audienceIn order to ensure reliability of systems early in the design phase, it is bec...
A new ESD testing system, the exponential-edge transmission line pulse system (EETLP), is presented....
Transmission line pulsing (TLP) is a useful technique to characterize electrostatic discharge (ESD) ...
This work describes, how the very fast transmission line pulsing (VFTLP)-technique can be used to ch...
The electrical characterization of devices and circuits regarding their electrostatic discharge (ESD...
As process technologies advance into deep sub-micrometer and nanometer scale, the charged device mod...
This paper presents a new measurement method that enables investigating the degradations of protecti...
A Transient safe operating area (TSOA) definition for ESD applications is introduced. Within this co...
International audienceUnderstanding the transient behavior of ESD protection devices is a key to opt...
International audienceA comprehensive study of the limitations of vf-TLP setup for transient measure...
This paper describes a test method which allows the investigation of the transient switching behavio...
International audienceThe key parameters in the optimization of the Diode Triggered Silicon-Controll...
International audienceIn order to ensure reliability of systems early in the design phase, it is bec...
A new ESD testing system, the exponential-edge transmission line pulse system (EETLP), is presented....
Transmission line pulsing (TLP) is a useful technique to characterize electrostatic discharge (ESD) ...
This work describes, how the very fast transmission line pulsing (VFTLP)-technique can be used to ch...
The electrical characterization of devices and circuits regarding their electrostatic discharge (ESD...
As process technologies advance into deep sub-micrometer and nanometer scale, the charged device mod...
This paper presents a new measurement method that enables investigating the degradations of protecti...
A Transient safe operating area (TSOA) definition for ESD applications is introduced. Within this co...