Add to ORKGA key design constraint of circuits used in hand-held devices is the power consumption, due mainly to the limitations of battery life. The employment of adaptive power management (APM) methods optimizes the power consumption of such circuits. This paper describes an effective APM-aware DFT technique that consists of a Test Generation Suite, including fault list generation, test pattern generation and fault simulation. The test generation suite is capable of generating test patterns for multiple supply voltage (Vdd) settings to maximize coverage of resistive bridging faults; and a method to reduce the number of Vdd settings without compromising the fault coverage in order to reduce the cost of test. Preliminarily validations of the proposed ...
[[abstract]]This paper presents the BIFEST, an ATPG system that combines the conventional ATPG proce...
UnrestrictedMany studies show that bridging defects are major causes of fabrication failures. A brid...
A DfT methodology for fault diagnosis in active analogue filters is presented that is capable of dia...
A key design constraint of circuits used in hand-held devices is the power consumption, mainly due t...
A key design constraint of circuits used in handheld devices is the power consumption, mainly due to...
Abstract—The use of multiple voltages for different cores is becoming a widely accepted technique fo...
This paper shows that existing delay-based testing techniques for power gating exhibit both fault co...
Systematic design for testability (DFT) is a technique to enhance the testability of design so that ...
Emerging non-volatile resistive RAM (RRAM) device technology has shown great potential to cultivate ...
Resistive Random Access Memory (RRAM) is one of the emerging memory devices that possesses a combi...
This paper proposes a new test approach that goes beyond cell-aware test, i.e., device-aware test. T...
[[abstract]]This paper presents BIFEST, an ATPG system that employs the built-in intermediate voltag...
© 2015 IEEE. A general method is proposed to automatically generate a DfT solution aiming at the det...
Dynamic fault-tolerance management (DFTM) was previously introduced as a means of providing environm...
High power consumption during at-speed delay fault testing may lead to yield loss and premature...
[[abstract]]This paper presents the BIFEST, an ATPG system that combines the conventional ATPG proce...
UnrestrictedMany studies show that bridging defects are major causes of fabrication failures. A brid...
A DfT methodology for fault diagnosis in active analogue filters is presented that is capable of dia...
A key design constraint of circuits used in hand-held devices is the power consumption, mainly due t...
A key design constraint of circuits used in handheld devices is the power consumption, mainly due to...
Abstract—The use of multiple voltages for different cores is becoming a widely accepted technique fo...
This paper shows that existing delay-based testing techniques for power gating exhibit both fault co...
Systematic design for testability (DFT) is a technique to enhance the testability of design so that ...
Emerging non-volatile resistive RAM (RRAM) device technology has shown great potential to cultivate ...
Resistive Random Access Memory (RRAM) is one of the emerging memory devices that possesses a combi...
This paper proposes a new test approach that goes beyond cell-aware test, i.e., device-aware test. T...
[[abstract]]This paper presents BIFEST, an ATPG system that employs the built-in intermediate voltag...
© 2015 IEEE. A general method is proposed to automatically generate a DfT solution aiming at the det...
Dynamic fault-tolerance management (DFTM) was previously introduced as a means of providing environm...
High power consumption during at-speed delay fault testing may lead to yield loss and premature...
[[abstract]]This paper presents the BIFEST, an ATPG system that combines the conventional ATPG proce...
UnrestrictedMany studies show that bridging defects are major causes of fabrication failures. A brid...
A DfT methodology for fault diagnosis in active analogue filters is presented that is capable of dia...