Major sources of transient errors in microprocessors today include noise and single event upsets. As feature sizes and voltages are reduced to create faster, more efficient, and computationally more powerful processors, these errors will increase significantly. We show that (contrary to conventional wisdom) error correction codes (ECC) can be efficiently utilized to handle these errors as instructions are being processed through the microprocessor pipeline. We will analyze some of the tradeoffs involved in a hardware implementation of ECC for the instruction queue with respect to performance, power, area, and reliability. Specifically, for an environment with high error rates, we show that we can correct all single bit errors with a negligi...
Abstract---Error correction codes (ECCs) have been used for decades to protect memories from soft er...
Numerous processor cores based on the popular RISC-V Instruction Set Architecture have been develope...
Recent research indicates that transient errors will increasingly become a critical concern in micro...
Major sources of transient errors in microprocessors today include noise and single event upsets. As...
This paper addresses the issue of reducing transient faults that affect instructions while they are ...
Servers and HPC systems often use a strong memory error correction code, or ECC, to meet their relia...
Special Issue on Defect and Fault ToleranceInternational audienceDrastic device shrinking, power sup...
Soft error tolerance is a hot research topic for modern microprocessors. We have been investigating ...
Soft errors (or Transient faults) are temporary faults that arise in a circuit due to a variety of i...
[EN] The continuous raise in the integration scale of CMOS technology has provoked an augment in the...
Soft errors are adding another dimension to the present day architecture design space. Different tec...
We propose a low cost concurrent error detection strategy to improve the Reliability, Availability, ...
We propose a low cost concurrent error detection strategy to improve the Reliability, Availability, ...
IEEE 20th International On-Line Testing Symposium (IOLTS) (2014 : Catalunya, SPAIN)Scaling supply vo...
Most server-grade memory systems provide Chipkill-Correct error protection at the expense of power a...
Abstract---Error correction codes (ECCs) have been used for decades to protect memories from soft er...
Numerous processor cores based on the popular RISC-V Instruction Set Architecture have been develope...
Recent research indicates that transient errors will increasingly become a critical concern in micro...
Major sources of transient errors in microprocessors today include noise and single event upsets. As...
This paper addresses the issue of reducing transient faults that affect instructions while they are ...
Servers and HPC systems often use a strong memory error correction code, or ECC, to meet their relia...
Special Issue on Defect and Fault ToleranceInternational audienceDrastic device shrinking, power sup...
Soft error tolerance is a hot research topic for modern microprocessors. We have been investigating ...
Soft errors (or Transient faults) are temporary faults that arise in a circuit due to a variety of i...
[EN] The continuous raise in the integration scale of CMOS technology has provoked an augment in the...
Soft errors are adding another dimension to the present day architecture design space. Different tec...
We propose a low cost concurrent error detection strategy to improve the Reliability, Availability, ...
We propose a low cost concurrent error detection strategy to improve the Reliability, Availability, ...
IEEE 20th International On-Line Testing Symposium (IOLTS) (2014 : Catalunya, SPAIN)Scaling supply vo...
Most server-grade memory systems provide Chipkill-Correct error protection at the expense of power a...
Abstract---Error correction codes (ECCs) have been used for decades to protect memories from soft er...
Numerous processor cores based on the popular RISC-V Instruction Set Architecture have been develope...
Recent research indicates that transient errors will increasingly become a critical concern in micro...